TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_00_56
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-008-024-06 | FUSED_ID : 6359364768457851270
  IC_TEMP :  -64.88 | VDDM : 1118.64 | AUX_INT :   -9.39 | CsaBias :   51.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29664e-03 / 2
  ADC_P0  : -9.39436e-03 ± 2.43481e-02
  ADC_P1  : 8.77973e-03 ± 6.14106e-04
  ADC_P2  : -6.89780e-06 ± 3.07867e-06
  CSA_Chi2/NDF : 2.15158e-04 / 2
  CSA_P0  : 5.76139e-02 ± 9.78365e-03
  CSA_P1  : 1.04772e-02 ± 7.37128e-04
  CSA_P2  : -6.04729e-05 ± 1.12256e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1847', '1.800', '0.1654', '1.800', '0.0863', '7.000', '0.7067', 1, 1, 1, 1, 1733828456.1822822]
VI_after__Init : ['1.201', '0.1847', '1.800', '0.1655', '1.800', '0.0811', '7.000', '0.7069', 1, 1, 1, 1, 1733828464.2426622]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1356', '1.804', '0.1107', '7.000', '0.7076', 1, 1, 1, 1, 1733828530.9645262]