TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_48_57
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-009-003-12 | FUSED_ID : 6359364768457855036
  IC_TEMP :  -71.89 | VDDM : 1113.31 | AUX_INT :  -11.37 | CsaBias :   57.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.04203e-03 / 2
  ADC_P0  : -1.13736e-02 ± 3.06286e-02
  ADC_P1  : 8.64647e-03 ± 7.52867e-04
  ADC_P2  : -6.77269e-06 ± 3.69141e-06
  CSA_Chi2/NDF : 1.70761e-04 / 2
  CSA_P0  : 5.98957e-02 ± 8.71599e-03
  CSA_P1  : 1.02698e-02 ± 6.56687e-04
  CSA_P2  : -5.78144e-05 ± 1.00006e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [40, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3277', '1.800', '0.1516', '1.800', '0.0941', '7.000', '0.7065', 1, 1, 1, 1, 1733831337.1674619]
VI_after__Init : ['1.201', '0.3288', '1.800', '0.1518', '1.799', '0.0886', '7.000', '0.7066', 1, 1, 1, 1, 1733831345.3218174]
VI_at__the_End : ['1.202', '0.4725', '1.800', '0.1357', '1.800', '0.1141', '7.000', '0.7072', 1, 1, 1, 1, 1733831410.2201562]