TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_42_05
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-009-007-12 | FUSED_ID : 6359364768457855100
  IC_TEMP :  -65.65 | VDDM : 1123.62 | AUX_INT :   -7.61 | CsaBias :   45.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.65012e-04 / 2
  ADC_P0  : -7.61345e-03 ± 1.98321e-02
  ADC_P1  : 8.83666e-03 ± 5.01223e-04
  ADC_P2  : -7.45554e-06 ± 2.50024e-06
  CSA_Chi2/NDF : 1.85106e-04 / 2
  CSA_P0  : 5.81027e-02 ± 9.07470e-03
  CSA_P1  : 1.05020e-02 ± 6.83713e-04
  CSA_P2  : -5.93446e-05 ± 1.04121e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4127', '1.800', '0.1186', '1.800', '0.0899', '7.000', '0.7066', 1, 1, 1, 1, 1733830925.5335958]
VI_after__Init : ['1.201', '0.4134', '1.800', '0.1188', '1.800', '0.0841', '7.000', '0.7065', 1, 1, 1, 1, 1733830933.553915]
VI_at__the_End : ['1.197', '0.4804', '1.800', '0.1424', '1.799', '0.1114', '7.000', '0.7073', 1, 1, 1, 1, 1733830991.4907782]