TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_40_23
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-009-008-12 | FUSED_ID : 6359364768457855116
  IC_TEMP :  -72.98 | VDDM : 1108.61 | AUX_INT :  -10.42 | CsaBias :   52.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49979e-03 / 2
  ADC_P0  : -1.04228e-02 ± 2.61528e-02
  ADC_P1  : 9.04346e-03 ± 6.66247e-04
  ADC_P2  : -7.85169e-06 ± 3.37717e-06
  CSA_Chi2/NDF : 1.90664e-04 / 2
  CSA_P0  : 6.11972e-02 ± 9.20994e-03
  CSA_P1  : 1.07309e-02 ± 6.93903e-04
  CSA_P2  : -6.51788e-05 ± 1.05673e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [0, 41, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1152', '1.800', '0.1278', '1.800', '0.0845', '7.000', '0.7072', 1, 1, 1, 1, 1733830823.209294]
VI_after__Init : ['1.202', '0.1152', '1.800', '0.1279', '1.800', '0.0771', '7.000', '0.7065', 1, 1, 1, 1, 1733830831.37571]
VI_at__the_End : ['1.201', '0.4738', '1.800', '0.1391', '1.804', '0.1146', '7.000', '0.7074', 1, 1, 1, 1, 1733830895.6116908]