TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_30_06
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-009-014-12 | FUSED_ID : 6359364768457855212
  IC_TEMP :  -76.58 | VDDM : 1122.35 | AUX_INT :   -9.36 | CsaBias :   45.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44152e-03 / 2
  ADC_P0  : -9.36326e-03 ± 2.57404e-02
  ADC_P1  : 9.12335e-03 ± 6.86889e-04
  ADC_P2  : -6.68508e-06 ± 3.65160e-06
  CSA_Chi2/NDF : 1.16344e-04 / 2
  CSA_P0  : 6.11111e-02 ± 7.19439e-03
  CSA_P1  : 1.08599e-02 ± 5.42045e-04
  CSA_P2  : -7.17032e-05 ± 8.25471e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3950', '1.800', '0.1304', '1.800', '0.0946', '7.000', '0.7072', 1, 1, 1, 1, 1733830205.5549686]
VI_after__Init : ['1.201', '0.3956', '1.800', '0.1309', '1.800', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1733830213.7601774]
VI_at__the_End : ['1.201', '0.4569', '1.800', '0.1396', '1.800', '0.1128', '7.000', '0.7079', 1, 1, 1, 1, 1733830275.0245013]