TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_26_39
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-009-016-11 | FUSED_ID : 6359364768457855243
  IC_TEMP :  -65.97 | VDDM : 1119.77 | AUX_INT :  -10.44 | CsaBias :   50.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73081e-03 / 2
  ADC_P0  : -1.04393e-02 ± 2.81868e-02
  ADC_P1  : 8.72314e-03 ± 7.04940e-04
  ADC_P2  : -6.72603e-06 ± 3.51153e-06
  CSA_Chi2/NDF : 1.87455e-04 / 2
  CSA_P0  : 5.82430e-02 ± 9.13211e-03
  CSA_P1  : 1.03251e-02 ± 6.88039e-04
  CSA_P2  : -5.95393e-05 ± 1.04780e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [68]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2323', '1.800', '0.1375', '1.800', '0.0827', '7.000', '0.7070', 1, 1, 1, 1, 1733829999.5945714]
VI_after__Init : ['1.201', '0.2324', '1.800', '0.1377', '1.801', '0.0778', '7.000', '0.7073', 1, 1, 1, 1, 1733830007.5260453]
VI_at__the_End : ['1.201', '0.4678', '1.800', '0.1349', '1.800', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1733830069.204293]