TEST_NAME : Wafer
TEST_DATE : 24_12_10-12_59_15
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-006-02 | FUSED_ID : 6359364768457859170
  IC_TEMP :  -70.61 | VDDM : 1122.67 | AUX_INT :   -8.25 | CsaBias :   52.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27998e-03 / 2
  ADC_P0  : -8.24602e-03 ± 2.42673e-02
  ADC_P1  : 8.69506e-03 ± 6.24733e-04
  ADC_P2  : -5.84374e-06 ± 3.19349e-06
  CSA_Chi2/NDF : 1.86887e-04 / 2
  CSA_P0  : 5.82314e-02 ± 9.11825e-03
  CSA_P1  : 1.03434e-02 ± 6.86994e-04
  CSA_P2  : -5.96794e-05 ± 1.04621e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [55, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2470', '1.800', '0.1450', '1.800', '0.0946', '7.000', '0.7066', 1, 1, 1, 1, 1733831954.6441498]
VI_after__Init : ['1.201', '0.2472', '1.800', '0.1451', '1.800', '0.0892', '7.000', '0.7068', 1, 1, 1, 1, 1733831963.3634646]
VI_at__the_End : ['1.196', '0.4625', '1.800', '0.1349', '1.800', '0.1134', '7.000', '0.7075', 1, 1, 1, 1, 1733832027.472732]