TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_04_24
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-009-02 | FUSED_ID : 6359364768457859218
  IC_TEMP :  -63.02 | VDDM : 1127.34 | AUX_INT :   -9.70 | CsaBias :   74.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43431e-03 / 2
  ADC_P0  : -9.70466e-03 ± 2.56308e-02
  ADC_P1  : 8.48553e-03 ± 6.25652e-04
  ADC_P2  : -6.32720e-06 ± 3.03935e-06
  CSA_Chi2/NDF : 1.33630e-04 / 2
  CSA_P0  : 5.64643e-02 ± 7.71036e-03
  CSA_P1  : 9.66017e-03 ± 5.80920e-04
  CSA_P2  : -4.99654e-05 ± 8.84672e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2014', '1.800', '0.1665', '1.800', '0.0808', '7.000', '0.7065', 1, 1, 1, 1, 1733832263.6587205]
VI_after__Init : ['1.202', '0.2018', '1.800', '0.1659', '1.800', '0.0764', '7.000', '0.7065', 1, 1, 1, 1, 1733832271.6401496]
VI_at__the_End : ['1.201', '0.4619', '1.800', '0.1332', '1.800', '0.1114', '7.000', '0.7072', 1, 1, 1, 1, 1733832334.761385]