TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_09_33
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-012-02 | FUSED_ID : 6359364768457859266
  IC_TEMP :  -67.58 | VDDM : 1125.28 | AUX_INT :  -10.19 | CsaBias :   60.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55602e-03 / 2
  ADC_P0  : -1.01893e-02 ± 2.66934e-02
  ADC_P1  : 8.85794e-03 ± 6.75657e-04
  ADC_P2  : -7.08359e-06 ± 3.40341e-06
  CSA_Chi2/NDF : 1.69403e-04 / 2
  CSA_P0  : 5.99899e-02 ± 8.68125e-03
  CSA_P1  : 1.02139e-02 ± 6.54070e-04
  CSA_P2  : -5.83031e-05 ± 9.96071e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [94, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3463', '1.800', '0.1626', '1.800', '0.0981', '7.000', '0.7065', 1, 1, 1, 1, 1733832572.724287]
VI_after__Init : ['1.201', '0.3470', '1.800', '0.1630', '1.800', '0.0927', '7.000', '0.7067', 1, 1, 1, 1, 1733832580.7386222]
VI_at__the_End : ['1.201', '0.4660', '1.800', '0.1387', '1.800', '0.1132', '7.000', '0.7072', 1, 1, 1, 1, 1733832642.9069614]