TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_16_26
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-016-05 | FUSED_ID : 6359364768457859333
  IC_TEMP :  -67.96 | VDDM : 1130.35 | AUX_INT :   -7.63 | CsaBias :   64.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14800e-03 / 2
  ADC_P0  : -7.62648e-03 ± 2.29554e-02
  ADC_P1  : 9.01683e-03 ± 6.09588e-04
  ADC_P2  : -6.70992e-06 ± 3.20161e-06
  CSA_Chi2/NDF : 1.56483e-04 / 2
  CSA_P0  : 6.16921e-02 ± 8.34364e-03
  CSA_P1  : 9.99385e-03 ± 6.28633e-04
  CSA_P2  : -5.50223e-05 ± 9.57333e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [51]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1859', '1.800', '0.1724', '1.800', '0.0904', '7.000', '0.7067', 1, 1, 1, 1, 1733832986.0057166]
VI_after__Init : ['1.201', '0.1861', '1.800', '0.1725', '1.800', '0.0850', '7.000', '0.7065', 1, 1, 1, 1, 1733832994.1781304]
VI_at__the_End : ['1.201', '0.4686', '1.800', '0.1371', '1.800', '0.1117', '7.000', '0.7071', 1, 1, 1, 1, 1733833053.7834697]