TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_19_53
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-018-05 | FUSED_ID : 6359364768457859365
  IC_TEMP :  -63.28 | VDDM : 1120.18 | AUX_INT :   -9.59 | CsaBias :   59.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43453e-03 / 2
  ADC_P0  : -9.58565e-03 ± 2.56414e-02
  ADC_P1  : 8.64002e-03 ± 6.39024e-04
  ADC_P2  : -6.49349e-06 ± 3.16819e-06
  CSA_Chi2/NDF : 1.48483e-04 / 2
  CSA_P0  : 5.95628e-02 ± 8.12757e-03
  CSA_P1  : 1.02505e-02 ± 6.12353e-04
  CSA_P2  : -5.76111e-05 ± 9.32542e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2581', '1.800', '0.1933', '1.800', '0.0929', '7.000', '0.7062', 1, 1, 1, 1, 1733833192.522631]
VI_after__Init : ['1.201', '0.2583', '1.800', '0.1920', '1.800', '0.0875', '7.000', '0.7065', 1, 1, 1, 1, 1733833201.2939844]
VI_at__the_End : ['1.201', '0.4723', '1.800', '0.1371', '1.799', '0.1076', '7.000', '0.7071', 1, 1, 1, 1, 1733833260.8893545]