TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_25_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-021-05 | FUSED_ID : 6359364768457859413
  IC_TEMP :  -68.34 | VDDM : 1126.21 | AUX_INT :   -7.32 | CsaBias :   62.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.60305e-04 / 2
  ADC_P0  : -7.32226e-03 ± 1.97715e-02
  ADC_P1  : 8.84178e-03 ± 4.98086e-04
  ADC_P2  : -7.69166e-06 ± 2.47054e-06
  CSA_Chi2/NDF : 1.56737e-04 / 2
  CSA_P0  : 5.82673e-02 ± 8.35043e-03
  CSA_P1  : 9.99032e-03 ± 6.29145e-04
  CSA_P2  : -5.35546e-05 ± 9.58113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2931', '1.800', '0.1593', '1.800', '0.0888', '7.000', '0.7070', 1, 1, 1, 1, 1733833502.9755952]
VI_after__Init : ['1.201', '0.2934', '1.800', '0.1596', '1.800', '0.0832', '7.000', '0.7069', 1, 1, 1, 1, 1733833511.135067]
VI_at__the_End : ['1.201', '0.4698', '1.800', '0.1353', '1.800', '0.1140', '6.999', '0.7076', 1, 1, 1, 1, 1733833577.2019665]