TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_54_15
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-011-017-08 | FUSED_ID : 6359364768457863448
  IC_TEMP :  -63.28 | VDDM : 1124.63 | AUX_INT :   -9.88 | CsaBias :   64.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42712e-03 / 2
  ADC_P0  : -9.88233e-03 ± 2.55663e-02
  ADC_P1  : 8.31317e-03 ± 6.13432e-04
  ADC_P2  : -5.86986e-06 ± 2.93709e-06
  CSA_Chi2/NDF : 1.47511e-04 / 2
  CSA_P0  : 5.89685e-02 ± 8.10093e-03
  CSA_P1  : 9.76285e-03 ± 6.10347e-04
  CSA_P2  : -5.21694e-05 ± 9.29486e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [28, 66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2728', '1.800', '0.1676', '1.800', '0.0942', '7.000', '0.7065', 1, 1, 1, 1, 1733835254.7382889]
VI_after__Init : ['1.201', '0.2730', '1.800', '0.1677', '1.799', '0.0891', '7.000', '0.7067', 1, 1, 1, 1, 1733835262.7446344]
VI_at__the_End : ['1.201', '0.4628', '1.800', '0.1342', '1.800', '0.1106', '7.000', '0.7072', 1, 1, 1, 1, 1733835323.0861182]