TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_52_32
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-011-018-08 | FUSED_ID : 6359364768457863464
  IC_TEMP :  -73.18 | VDDM : 1125.95 | AUX_INT :   -8.54 | CsaBias :   54.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09441e-03 / 2
  ADC_P0  : -8.54113e-03 ± 2.23398e-02
  ADC_P1  : 9.08643e-03 ± 5.80883e-04
  ADC_P2  : -7.72580e-06 ± 2.99064e-06
  CSA_Chi2/NDF : 1.56494e-04 / 2
  CSA_P0  : 5.81386e-02 ± 8.34394e-03
  CSA_P1  : 1.05071e-02 ± 6.28656e-04
  CSA_P2  : -6.47448e-05 ± 9.57369e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1339', '1.800', '0.1050', '1.800', '0.0852', '7.000', '0.7071', 1, 1, 1, 1, 1733835151.5153089]
VI_after__Init : ['1.201', '0.1339', '1.800', '0.1050', '1.800', '0.0789', '7.000', '0.7065', 1, 1, 1, 1, 1733835159.5706182]
VI_at__the_End : ['1.201', '0.4563', '1.800', '0.1338', '1.805', '0.1161', '7.000', '0.7074', 1, 1, 1, 1, 1733835219.9038754]