TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_42_13
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-011-024-08 | FUSED_ID : 6359364768457863560
  IC_TEMP :  -64.11 | VDDM : 1123.99 | AUX_INT :   -7.72 | CsaBias :   62.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80519e-04 / 2
  ADC_P0  : -7.71503e-03 ± 2.11489e-02
  ADC_P1  : 8.85545e-03 ± 5.39433e-04
  ADC_P2  : -7.24552e-06 ± 2.71677e-06
  CSA_Chi2/NDF : 1.49313e-04 / 2
  CSA_P0  : 6.16044e-02 ± 8.15024e-03
  CSA_P1  : 1.00626e-02 ± 6.14062e-04
  CSA_P2  : -5.29161e-05 ± 9.35144e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [9, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3550', '1.800', '0.1418', '1.800', '0.0880', '7.000', '0.7071', 1, 1, 1, 1, 1733834533.303624]
VI_after__Init : ['1.202', '0.3554', '1.800', '0.1418', '1.799', '0.0826', '7.000', '0.7072', 1, 1, 1, 1, 1733834541.326901]
VI_at__the_End : ['1.201', '0.4812', '1.800', '0.1365', '1.800', '0.1113', '7.000', '0.7076', 1, 1, 1, 1, 1733834604.6150596]