TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_40_30
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-011-025-08 | FUSED_ID : 6359364768457863576
  IC_TEMP :  -62.70 | VDDM : 1126.40 | AUX_INT :   -8.40 | CsaBias :   76.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18610e-03 / 2
  ADC_P0  : -8.40081e-03 ± 2.32827e-02
  ADC_P1  : 8.58222e-03 ± 5.74528e-04
  ADC_P2  : -6.77930e-06 ± 2.80342e-06
  CSA_Chi2/NDF : 1.88467e-04 / 2
  CSA_P0  : 5.76512e-02 ± 9.15672e-03
  CSA_P1  : 1.02228e-02 ± 6.89893e-04
  CSA_P2  : -5.40161e-05 ± 1.05063e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3526', '1.800', '0.1648', '1.800', '0.0926', '7.000', '0.7071', 1, 1, 1, 1, 1733834429.93152]
VI_after__Init : ['1.201', '0.3529', '1.800', '0.1651', '1.800', '0.0870', '7.000', '0.7073', 1, 1, 1, 1, 1733834437.9098482]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1364', '1.802', '0.1092', '7.000', '0.7077', 1, 1, 1, 1, 1733834500.7781482]