TEST_NAME : Wafer
TEST_DATE : 24_12_10-14_31_49
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-012-008-07 | FUSED_ID : 6359364768457867399
  IC_TEMP :  -68.38 | VDDM : 1128.00 | AUX_INT :   -7.83 | CsaBias :   53.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08984e-03 / 2
  ADC_P0  : -7.82554e-03 ± 2.23654e-02
  ADC_P1  : 8.82373e-03 ± 5.82982e-04
  ADC_P2  : -6.16021e-06 ± 3.01451e-06
  CSA_Chi2/NDF : 1.46623e-04 / 2
  CSA_P0  : 6.00640e-02 ± 8.07651e-03
  CSA_P1  : 1.01956e-02 ± 6.08507e-04
  CSA_P2  : -5.73434e-05 ± 9.26684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [9]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3878', '1.800', '0.1573', '1.799', '0.0936', '7.000', '0.7066', 1, 1, 1, 1, 1733837509.5149813]
VI_after__Init : ['1.201', '0.3886', '1.800', '0.1575', '1.799', '0.0875', '7.000', '0.7068', 1, 1, 1, 1, 1733837517.5624006]
VI_at__the_End : ['1.201', '0.4705', '1.800', '0.1376', '1.802', '0.1104', '6.999', '0.7065', 1, 1, 1, 1, 1733837577.4849403]