TEST_NAME : Wafer
TEST_DATE : 24_12_10-14_47_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-012-017-00 | FUSED_ID : 6359364768457867536
  IC_TEMP :  -68.76 | VDDM : 1129.75 | AUX_INT :   -8.55 | CsaBias :   35.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00925e-03 / 2
  ADC_P0  : -8.54993e-03 ± 2.13800e-02
  ADC_P1  : 8.94289e-03 ± 5.32668e-04
  ADC_P2  : -8.45716e-06 ± 2.61679e-06
  CSA_Chi2/NDF : 1.60355e-04 / 2
  CSA_P0  : 5.75573e-02 ± 8.44625e-03
  CSA_P1  : 9.96565e-03 ± 6.36364e-04
  CSA_P2  : -5.51867e-05 ± 9.69107e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [26]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [56, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3445', '1.800', '0.1449', '1.799', '0.0943', '7.000', '0.7065', 1, 1, 1, 1, 1733838422.9709067]
VI_after__Init : ['1.202', '0.3451', '1.800', '0.1437', '1.800', '0.0887', '7.000', '0.7065', 1, 1, 1, 1, 1733838431.7302516]
VI_at__the_End : ['1.201', '0.4618', '1.800', '0.1345', '1.800', '0.1115', '7.000', '0.7071', 1, 1, 1, 1, 1733838497.0584338]