TEST_NAME : Wafer
TEST_DATE : 24_12_10-14_50_29
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-012-019-00 | FUSED_ID : 6359364768457867568
  IC_TEMP :  -61.65 | VDDM : 1120.51 | AUX_INT :   -8.52 | CsaBias :   73.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27071e-03 / 2
  ADC_P0  : -8.51743e-03 ± 2.41455e-02
  ADC_P1  : 8.25585e-03 ± 5.81898e-04
  ADC_P2  : -5.72911e-06 ± 2.78141e-06
  CSA_Chi2/NDF : 1.20502e-04 / 2
  CSA_P0  : 5.84377e-02 ± 7.32182e-03
  CSA_P1  : 9.80954e-03 ± 5.51646e-04
  CSA_P2  : -5.24699e-05 ± 8.40092e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [11, 16, 23]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2561', '1.800', '0.1278', '1.799', '0.0891', '7.000', '0.7062', 1, 1, 1, 1, 1733838628.995423]
VI_after__Init : ['1.202', '0.2561', '1.800', '0.1279', '1.800', '0.0838', '7.000', '0.7064', 1, 1, 1, 1, 1733838637.1867952]
VI_at__the_End : ['1.201', '0.4644', '1.800', '0.1328', '1.800', '0.1101', '7.000', '0.7072', 1, 1, 1, 1, 1733838695.7423995]