TEST_NAME : Wafer
TEST_DATE : 24_12_10-14_53_55
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-012-021-00 | FUSED_ID : 6359364768457867600
  IC_TEMP :  -67.02 | VDDM : 1123.50 | AUX_INT :   -7.30 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10661e-03 / 2
  ADC_P0  : -7.29810e-03 ± 2.25971e-02
  ADC_P1  : 8.41633e-03 ± 5.77811e-04
  ADC_P2  : -4.59670e-06 ± 2.93731e-06
  CSA_Chi2/NDF : 1.96069e-04 / 2
  CSA_P0  : 5.83872e-02 ± 9.33957e-03
  CSA_P1  : 1.06269e-02 ± 7.03669e-04
  CSA_P2  : -6.54455e-05 ± 1.07161e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [40, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3559', '1.800', '0.1597', '1.800', '0.0928', '7.000', '0.7066', 1, 1, 1, 1, 1733838835.2138374]
VI_after__Init : ['1.202', '0.3567', '1.800', '0.1603', '1.800', '0.0871', '7.000', '0.7062', 1, 1, 1, 1, 1733838843.331231]
VI_at__the_End : ['1.194', '0.4645', '1.800', '0.1351', '1.808', '0.1121', '7.000', '0.7070', 1, 1, 1, 1, 1733838906.5024133]