TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_07_45
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-014-015-04 | FUSED_ID : 6359364768457875700
  IC_TEMP :  -59.60 | VDDM : 1127.50 | AUX_INT :   -7.44 | CsaBias :   67.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.89811e-04 / 2
  ADC_P0  : -7.43886e-03 ± 2.13015e-02
  ADC_P1  : 8.33466e-03 ± 5.22170e-04
  ADC_P2  : -5.71045e-06 ± 2.53460e-06
  CSA_Chi2/NDF : 1.22596e-04 / 2
  CSA_P0  : 5.68019e-02 ± 7.38517e-03
  CSA_P1  : 9.50732e-03 ± 5.56419e-04
  CSA_P2  : -4.54752e-05 ± 8.47360e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [16]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2669', '1.800', '0.1332', '1.800', '0.0887', '7.000', '0.7066', 1, 1, 1, 1, 1733843264.5370655]
VI_after__Init : ['1.202', '0.2670', '1.800', '0.1332', '1.801', '0.0832', '7.000', '0.7064', 1, 1, 1, 1, 1733843272.7543805]
VI_at__the_End : ['1.202', '0.4714', '1.800', '0.1342', '1.804', '0.1111', '7.000', '0.7069', 1, 1, 1, 1, 1733843339.4606142]