TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_18_05
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-014-021-03 | FUSED_ID : 6359364768457875795
  IC_TEMP :  -60.14 | VDDM : 1120.42 | AUX_INT :   -9.29 | CsaBias :   73.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31054e-03 / 2
  ADC_P0  : -9.28679e-03 ± 2.45179e-02
  ADC_P1  : 8.28815e-03 ± 5.91461e-04
  ADC_P2  : -5.63069e-06 ± 2.84519e-06
  CSA_Chi2/NDF : 1.92154e-04 / 2
  CSA_P0  : 5.70589e-02 ± 9.24586e-03
  CSA_P1  : 1.01469e-02 ± 6.96609e-04
  CSA_P2  : -5.54685e-05 ± 1.06085e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [24]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [43, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4271', '1.800', '0.1356', '1.800', '0.0950', '7.000', '0.7075', 1, 1, 1, 1, 1733843884.5935795]
VI_after__Init : ['1.202', '0.4278', '1.800', '0.1363', '1.801', '0.0876', '7.000', '0.7064', 1, 1, 1, 1, 1733843893.3748107]
VI_at__the_End : ['1.201', '0.4745', '1.800', '0.1325', '1.805', '0.1086', '7.000', '0.7072', 1, 1, 1, 1, 1733843952.4955537]