TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_24_57
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-014-025-03 | FUSED_ID : 6359364768457875859
  IC_TEMP :  -62.77 | VDDM : 1122.19 | AUX_INT :   -7.08 | CsaBias :   67.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85580e-04 / 2
  ADC_P0  : -7.07991e-03 ± 2.12720e-02
  ADC_P1  : 8.28134e-03 ± 5.24271e-04
  ADC_P2  : -5.31624e-06 ± 2.55660e-06
  CSA_Chi2/NDF : 1.50413e-04 / 2
  CSA_P0  : 5.66222e-02 ± 8.18022e-03
  CSA_P1  : 9.47506e-03 ± 6.16320e-04
  CSA_P2  : -4.53124e-05 ± 9.38583e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3514', '1.800', '0.1561', '1.799', '0.0908', '7.000', '0.7070', 1, 1, 1, 1, 1733844296.8955472]
VI_after__Init : ['1.202', '0.3516', '1.800', '0.1563', '1.801', '0.0852', '7.000', '0.7069', 1, 1, 1, 1, 1733844304.9678383]
VI_at__the_End : ['1.201', '0.4672', '1.800', '0.1314', '1.804', '0.1085', '7.000', '0.7076', 1, 1, 1, 1, 1733844367.180164]