TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_40_26
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-015-018-14 | FUSED_ID : 6359364768457879854
  IC_TEMP :  -66.66 | VDDM : 1132.34 | AUX_INT :   -8.23 | CsaBias :   58.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10552e-03 / 2
  ADC_P0  : -8.22623e-03 ± 2.24951e-02
  ADC_P1  : 8.37606e-03 ± 5.48462e-04
  ADC_P2  : -6.02195e-06 ± 2.64988e-06
  CSA_Chi2/NDF : 1.37440e-04 / 2
  CSA_P0  : 5.95821e-02 ± 7.81950e-03
  CSA_P1  : 9.90600e-03 ± 5.89143e-04
  CSA_P2  : -5.23321e-05 ± 8.97195e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3376', '1.800', '0.1219', '1.800', '0.0873', '7.000', '0.7069', 1, 1, 1, 1, 1733845225.944855]
VI_after__Init : ['1.201', '0.3379', '1.800', '0.1220', '1.800', '0.0817', '7.000', '0.7071', 1, 1, 1, 1, 1733845233.9691427]
VI_at__the_End : ['1.202', '0.4718', '1.800', '0.1345', '1.799', '0.1108', '7.000', '0.7076', 1, 1, 1, 1, 1733845301.0263557]