TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_30_06
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-015-024-14 | FUSED_ID : 6359364768457879950
  IC_TEMP :  -56.29 | VDDM : 1117.01 | AUX_INT :   -8.83 | CsaBias :   84.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48022e-03 / 2
  ADC_P0  : -8.83278e-03 ± 2.61339e-02
  ADC_P1  : 7.85314e-03 ± 6.08598e-04
  ADC_P2  : -4.60492e-06 ± 2.82134e-06
  CSA_Chi2/NDF : 1.26073e-04 / 2
  CSA_P0  : 5.50043e-02 ± 7.48916e-03
  CSA_P1  : 9.42660e-03 ± 5.64254e-04
  CSA_P2  : -4.34465e-05 ± 8.59292e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3431', '1.800', '0.1245', '1.799', '0.0919', '7.000', '0.7070', 1, 1, 1, 1, 1733844606.318111]
VI_after__Init : ['1.201', '0.3430', '1.800', '0.1245', '1.801', '0.0864', '7.000', '0.7069', 1, 1, 1, 1, 1733844614.4214795]
VI_at__the_End : ['1.200', '0.4748', '1.800', '0.1317', '1.808', '0.1090', '7.000', '0.7076', 1, 1, 1, 1, 1733844679.7494645]