TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_28_23
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-015-025-14 | FUSED_ID : 6359364768457879966
  IC_TEMP :  -78.30 | VDDM : 1131.67 | AUX_INT :   -7.94 | CsaBias :   69.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11436e-03 / 2
  ADC_P0  : -7.94332e-03 ± 2.26001e-02
  ADC_P1  : 8.68321e-03 ± 5.74547e-04
  ADC_P2  : -6.33141e-06 ± 2.89174e-06
  CSA_Chi2/NDF : 1.46024e-04 / 2
  CSA_P0  : 1.43050e-01 ± 8.06000e-03
  CSA_P1  : 9.10225e-03 ± 6.07263e-04
  CSA_P2  : -4.82468e-05 ± 9.24790e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [77, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [44, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2866', '1.800', '0.1394', '1.800', '0.0887', '7.000', '0.7070', 1, 1, 1, 1, 1733844502.6489184]
VI_after__Init : ['1.202', '0.2867', '1.800', '0.1394', '1.802', '0.0833', '7.000', '0.7069', 1, 1, 1, 1, 1733844510.7542515]
VI_at__the_End : ['1.201', '0.5207', '1.800', '0.1309', '1.805', '0.1109', '7.000', '0.7075', 1, 1, 1, 1, 1733844573.6995416]