TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_06_12
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-006-01 | FUSED_ID : 6359364768457883745
  IC_TEMP :  -66.43 | VDDM : 1123.69 | AUX_INT : -218.73 | CsaBias : -117.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48599e-03 / 2
  ADC_P0  : -2.18729e-01 ± 3.78768e-02
  ADC_P1  : 1.14512e-02 ± 8.48572e-04
  ADC_P2  : -1.66780e-05 ± 3.75151e-06
  CSA_Chi2/NDF : 1.81857e-04 / 2
  CSA_P0  : 5.43118e-02 ± 8.99470e-03
  CSA_P1  : 9.77810e-03 ± 6.77686e-04
  CSA_P2  : -5.18572e-05 ± 1.03204e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2053', '1.800', '0.1617', '1.800', '0.0942', '7.000', '0.7075', 1, 1, 1, 1, 1733846771.8972237]
VI_after__Init : ['1.201', '0.2054', '1.800', '0.1617', '1.799', '0.0869', '7.000', '0.7071', 1, 1, 1, 1, 1733846779.84442]
VI_at__the_End : ['1.201', '0.4599', '1.800', '0.1277', '1.804', '0.1112', '7.000', '0.7078', 1, 1, 1, 1, 1733846841.8597963]