TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_07_54
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-007-01 | FUSED_ID : 6359364768457883761
  IC_TEMP :  -65.16 | VDDM : 1120.87 | AUX_INT :   -8.68 | CsaBias :   68.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39445e-03 / 2
  ADC_P0  : -8.68476e-03 ± 2.52842e-02
  ADC_P1  : 8.61690e-03 ± 6.29520e-04
  ADC_P2  : -6.65410e-06 ± 3.10068e-06
  CSA_Chi2/NDF : 1.59604e-04 / 2
  CSA_P0  : 5.72972e-02 ± 8.42644e-03
  CSA_P1  : 9.79270e-03 ± 6.34871e-04
  CSA_P2  : -5.11486e-05 ± 9.66834e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1995', '1.800', '0.1299', '1.800', '0.0849', '7.000', '0.7069', 1, 1, 1, 1, 1733846874.4363935]
VI_after__Init : ['1.202', '0.1997', '1.800', '0.1300', '1.801', '0.0794', '7.000', '0.7070', 1, 1, 1, 1, 1733846882.471774]
VI_at__the_End : ['1.201', '0.4668', '1.800', '0.1314', '1.800', '0.1135', '7.000', '0.7077', 1, 1, 1, 1, 1733846944.0290742]