TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_13_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-010-01 | FUSED_ID : 6359364768457883809
  IC_TEMP :  -58.67 | VDDM : 1120.69 | AUX_INT :   -9.71 | CsaBias :   72.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52939e-03 / 2
  ADC_P0  : -9.70898e-03 ± 2.65252e-02
  ADC_P1  : 8.31269e-03 ± 6.45522e-04
  ADC_P2  : -5.47439e-06 ± 3.13421e-06
  CSA_Chi2/NDF : 1.57955e-04 / 2
  CSA_P0  : 5.73111e-02 ± 8.38279e-03
  CSA_P1  : 9.94393e-03 ± 6.31582e-04
  CSA_P2  : -5.02768e-05 ± 9.61825e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2204', '1.800', '0.1711', '1.799', '0.0867', '7.000', '0.7070', 1, 1, 1, 1, 1733847183.4898443]
VI_after__Init : ['1.201', '0.2205', '1.800', '0.1711', '1.800', '0.0812', '7.000', '0.7069', 1, 1, 1, 1, 1733847191.532269]
VI_at__the_End : ['1.201', '0.4792', '1.800', '0.1329', '1.803', '0.1092', '7.000', '0.7078', 1, 1, 1, 1, 1733847257.8182132]