TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_14_46
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-011-01 | FUSED_ID : 6359364768457883825
  IC_TEMP :  -58.25 | VDDM : 1125.54 | AUX_INT :   -8.23 | CsaBias :   59.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26789e-03 / 2
  ADC_P0  : -8.23235e-03 ± 2.41357e-02
  ADC_P1  : 8.54859e-03 ± 6.06186e-04
  ADC_P2  : -5.99998e-06 ± 3.01703e-06
  CSA_Chi2/NDF : 1.60120e-04 / 2
  CSA_P0  : 5.69171e-02 ± 8.44006e-03
  CSA_P1  : 9.78171e-03 ± 6.35898e-04
  CSA_P2  : -4.92622e-05 ± 9.68397e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [29, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4338', '1.800', '0.1191', '1.800', '0.0978', '7.000', '0.7070', 1, 1, 1, 1, 1733847286.4470527]
VI_after__Init : ['1.201', '0.4348', '1.800', '0.1196', '1.802', '0.0919', '7.000', '0.7071', 1, 1, 1, 1, 1733847294.4904304]
VI_at__the_End : ['1.201', '0.4733', '1.800', '0.1325', '1.800', '0.1101', '7.000', '0.7077', 1, 1, 1, 1, 1733847354.6385362]