TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_16_30
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-012-01 | FUSED_ID : 6359364768457883841
  IC_TEMP :  -61.96 | VDDM : 1118.50 | AUX_INT :   -8.05 | CsaBias :   73.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15188e-03 / 2
  ADC_P0  : -8.05352e-03 ± 2.30128e-02
  ADC_P1  : 8.18928e-03 ± 5.59358e-04
  ADC_P2  : -5.11690e-06 ± 2.70089e-06
  CSA_Chi2/NDF : 1.82410e-04 / 2
  CSA_P0  : 5.80351e-02 ± 9.00838e-03
  CSA_P1  : 9.90850e-03 ± 6.78716e-04
  CSA_P2  : -5.26185e-05 ± 1.03360e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3561', '1.800', '0.1547', '1.800', '0.0949', '7.000', '0.7071', 1, 1, 1, 1, 1733847390.138707]
VI_after__Init : ['1.201', '0.3565', '1.800', '0.1549', '1.799', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1733847398.4140382]
VI_at__the_End : ['1.201', '0.4688', '1.800', '0.1335', '1.800', '0.1118', '7.000', '0.7077', 1, 1, 1, 1, 1733847458.0053296]