TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_30_15
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-020-06 | FUSED_ID : 6359364768457883974
  IC_TEMP :  -69.32 | VDDM : 1117.13 | AUX_INT :   -9.54 | CsaBias :   58.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43142e-03 / 2
  ADC_P0  : -9.53798e-03 ± 2.55969e-02
  ADC_P1  : 8.49684e-03 ± 6.22864e-04
  ADC_P2  : -6.57137e-06 ± 3.00909e-06
  CSA_Chi2/NDF : 1.81459e-04 / 2
  CSA_P0  : 5.77104e-02 ± 8.98487e-03
  CSA_P1  : 1.02742e-02 ± 6.76945e-04
  CSA_P2  : -5.98758e-05 ± 1.03091e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1876', '1.800', '0.1587', '1.799', '0.0894', '7.000', '0.7074', 1, 1, 1, 1, 1733848214.7659144]
VI_after__Init : ['1.201', '0.1876', '1.800', '0.1587', '1.800', '0.0821', '7.000', '0.7065', 1, 1, 1, 1, 1733848222.9132605]
VI_at__the_End : ['1.201', '0.4627', '1.800', '0.1332', '1.800', '0.1105', '7.000', '0.7072', 1, 1, 1, 1, 1733848289.2871103]