TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_31_57
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-016-021-06 | FUSED_ID : 6359364768457883990
  IC_TEMP :  -59.88 | VDDM : 1116.70 | AUX_INT :   -8.23 | CsaBias :   72.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35861e-03 / 2
  ADC_P0  : -8.22993e-03 ± 2.50129e-02
  ADC_P1  : 8.08584e-03 ± 5.99035e-04
  ADC_P2  : -5.07188e-06 ± 2.84592e-06
  CSA_Chi2/NDF : 1.33374e-04 / 2
  CSA_P0  : 5.50957e-02 ± 7.70297e-03
  CSA_P1  : 9.51022e-03 ± 5.80363e-04
  CSA_P2  : -4.69620e-05 ± 8.83824e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2869', '1.800', '0.1283', '1.800', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1733848317.219954]
VI_after__Init : ['1.201', '0.2868', '1.800', '0.1283', '1.800', '0.0855', '7.000', '0.7066', 1, 1, 1, 1, 1733848325.2593586]
VI_at__the_End : ['1.201', '0.4641', '1.800', '0.1310', '1.804', '0.1081', '7.000', '0.7072', 1, 1, 1, 1, 1733848387.934412]