TEST_NAME : Wafer
TEST_DATE : 24_12_10-18_00_57
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-008-12 | FUSED_ID : 6359364768457887884
  IC_TEMP :  -58.54 | VDDM : 1122.01 | AUX_INT :  -29.67 | CsaBias :   48.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.20652e-03 / 2
  ADC_P0  : -2.96661e-02 ± 3.29947e-02
  ADC_P1  : 8.72101e-03 ± 7.95186e-04
  ADC_P2  : -6.95464e-06 ± 3.82959e-06
  CSA_Chi2/NDF : 1.46204e-04 / 2
  CSA_P0  : 5.71484e-02 ± 8.06495e-03
  CSA_P1  : 9.71426e-03 ± 6.07636e-04
  CSA_P2  : -4.91076e-05 ± 9.25358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1933', '1.800', '0.1293', '1.800', '0.0835', '7.000', '0.7065', 1, 1, 1, 1, 1733850056.5793338]
VI_after__Init : ['1.201', '0.1935', '1.800', '0.1293', '1.800', '0.0785', '7.000', '0.7064', 1, 1, 1, 1, 1733850064.7507052]
VI_at__the_End : ['1.201', '0.4706', '1.800', '0.1318', '1.799', '0.1100', '7.000', '0.7069', 1, 1, 1, 1, 1733850125.097086]