TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_59_14
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-009-12 | FUSED_ID : 6359364768457887900
  IC_TEMP :  -62.76 | VDDM : 1105.18 | AUX_INT :   -8.10 | CsaBias :   66.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07317e-03 / 2
  ADC_P0  : -8.09640e-03 ± 2.21636e-02
  ADC_P1  : 8.36546e-03 ± 5.40380e-04
  ADC_P2  : -5.99883e-06 ± 2.61083e-06
  CSA_Chi2/NDF : 2.09664e-04 / 2
  CSA_P0  : 5.51864e-02 ± 9.65794e-03
  CSA_P1  : 9.88622e-03 ± 7.27656e-04
  CSA_P2  : -5.29646e-05 ± 1.10813e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2052', '1.800', '0.1664', '1.800', '0.0874', '7.000', '0.7062', 1, 1, 1, 1, 1733849954.2221572]
VI_after__Init : ['1.201', '0.2054', '1.800', '0.1664', '1.802', '0.0823', '7.000', '0.7065', 1, 1, 1, 1, 1733849962.4195051]
VI_at__the_End : ['1.201', '0.4681', '1.800', '0.1327', '1.799', '0.1089', '7.000', '0.7072', 1, 1, 1, 1, 1733850024.013725]