TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_54_05
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-012-12 | FUSED_ID : 6359364768457887948
  IC_TEMP :  -59.05 | VDDM : 1131.45 | AUX_INT :   -7.88 | CsaBias :   68.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21320e-03 / 2
  ADC_P0  : -7.87789e-03 ± 2.36350e-02
  ADC_P1  : 8.49515e-03 ± 5.98905e-04
  ADC_P2  : -5.38495e-06 ± 3.01234e-06
  CSA_Chi2/NDF : 1.62251e-04 / 2
  CSA_P0  : 5.83345e-02 ± 8.49602e-03
  CSA_P1  : 1.00827e-02 ± 6.40114e-04
  CSA_P2  : -5.16911e-05 ± 9.74818e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [0, 68, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2619', '1.800', '0.1210', '1.800', '0.0915', '7.000', '0.7066', 1, 1, 1, 1, 1733849644.5479467]
VI_after__Init : ['1.201', '0.2619', '1.800', '0.1210', '1.800', '0.0844', '7.000', '0.7062', 1, 1, 1, 1, 1733849653.3401108]
VI_at__the_End : ['1.201', '0.4838', '1.800', '0.1360', '1.800', '0.1097', '7.000', '0.7071', 1, 1, 1, 1, 1733849716.2343864]