TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_52_22
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-013-12 | FUSED_ID : 6359364768457887964
  IC_TEMP :  -63.96 | VDDM : 1120.22 | AUX_INT :   -8.61 | CsaBias :   59.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13806e-03 / 2
  ADC_P0  : -8.61240e-03 ± 2.28210e-02
  ADC_P1  : 8.54463e-03 ± 5.66762e-04
  ADC_P2  : -6.19836e-06 ± 2.79677e-06
  CSA_Chi2/NDF : 1.88266e-04 / 2
  CSA_P0  : 5.70315e-02 ± 9.15184e-03
  CSA_P1  : 1.01422e-02 ± 6.89525e-04
  CSA_P2  : -5.65554e-05 ± 1.05007e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2455', '1.800', '0.1507', '1.800', '0.0876', '7.000', '0.7062', 1, 1, 1, 1, 1733849541.9757378]
VI_after__Init : ['1.201', '0.2456', '1.800', '0.1508', '1.800', '0.0818', '7.000', '0.7064', 1, 1, 1, 1, 1733849550.215094]
VI_at__the_End : ['1.201', '0.4685', '1.800', '0.1355', '1.800', '0.1094', '7.000', '0.7069', 1, 1, 1, 1, 1733849612.750286]