TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_50_39
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-014-12 | FUSED_ID : 6359364768457887980
  IC_TEMP :  -54.20 | VDDM : 1125.10 | AUX_INT :   -7.82 | CsaBias :   81.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24496e-03 / 2
  ADC_P0  : -7.81863e-03 ± 2.39847e-02
  ADC_P1  : 8.15030e-03 ± 5.93263e-04
  ADC_P2  : -4.28826e-06 ± 2.92119e-06
  CSA_Chi2/NDF : 1.73994e-04 / 2
  CSA_P0  : 5.63588e-02 ± 8.79812e-03
  CSA_P1  : 1.02650e-02 ± 6.62875e-04
  CSA_P2  : -5.38231e-05 ± 1.00948e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [4]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4745', '1.800', '0.1637', '1.800', '0.0950', '7.000', '0.7062', 1, 1, 1, 1, 1733849438.9446394]
VI_after__Init : ['1.201', '0.4757', '1.800', '0.1647', '1.799', '0.0891', '7.000', '0.7064', 1, 1, 1, 1, 1733849447.1918778]
VI_at__the_End : ['1.201', '0.4833', '1.800', '0.1368', '1.799', '0.1093', '7.000', '0.7070', 1, 1, 1, 1, 1733849514.2738998]