TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_48_55
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-015-12 | FUSED_ID : 6359364768457887996
  IC_TEMP :  -65.58 | VDDM : 1115.73 | AUX_INT :   -9.03 | CsaBias :   56.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42009e-03 / 2
  ADC_P0  : -9.02575e-03 ± 2.55786e-02
  ADC_P1  : 8.25580e-03 ± 6.25866e-04
  ADC_P2  : -5.04972e-06 ± 3.05307e-06
  CSA_Chi2/NDF : 1.84113e-04 / 2
  CSA_P0  : 5.53276e-02 ± 9.05034e-03
  CSA_P1  : 1.02327e-02 ± 6.81878e-04
  CSA_P2  : -5.80075e-05 ± 1.03842e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3372', '1.800', '0.1203', '1.800', '0.0905', '7.000', '0.7063', 1, 1, 1, 1, 1733849335.5507443]
VI_after__Init : ['1.201', '0.3375', '1.800', '0.1203', '1.799', '0.0849', '7.000', '0.7065', 1, 1, 1, 1, 1733849343.7587564]
VI_at__the_End : ['1.201', '0.4637', '1.800', '0.1334', '1.803', '0.1105', '7.000', '0.7072', 1, 1, 1, 1, 1733849411.2247152]