TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_47_13
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-016-11 | FUSED_ID : 6359364768457888011
  IC_TEMP :  -60.29 | VDDM : 1119.29 | AUX_INT :  -10.10 | CsaBias :   86.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57598e-03 / 2
  ADC_P0  : -1.01009e-02 ± 2.68721e-02
  ADC_P1  : 8.08683e-03 ± 6.21258e-04
  ADC_P2  : -5.94178e-06 ± 2.85605e-06
  CSA_Chi2/NDF : 1.33896e-04 / 2
  CSA_P0  : 5.73983e-02 ± 7.71803e-03
  CSA_P1  : 9.13473e-03 ± 5.81498e-04
  CSA_P2  : -4.03699e-05 ± 8.85552e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3826', '1.800', '0.1564', '1.799', '0.0929', '7.000', '0.7063', 1, 1, 1, 1, 1733849232.8694596]
VI_after__Init : ['1.201', '0.3830', '1.800', '0.1565', '1.801', '0.0871', '7.000', '0.7065', 1, 1, 1, 1, 1733849240.9736717]
VI_at__the_End : ['1.201', '0.4672', '1.800', '0.1323', '1.805', '0.1097', '7.000', '0.7072', 1, 1, 1, 1, 1733849305.014775]