TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_45_29
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-017-11 | FUSED_ID : 6359364768457888027
  IC_TEMP :  -61.83 | VDDM : 1109.94 | AUX_INT :  -11.02 | CsaBias :   61.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.19599e-03 / 2
  ADC_P0  : -1.10248e-02 ± 3.18751e-02
  ADC_P1  : 8.14503e-03 ± 7.60615e-04
  ADC_P2  : -5.06759e-06 ± 3.63132e-06
  CSA_Chi2/NDF : 1.81814e-04 / 2
  CSA_P0  : 5.68694e-02 ± 8.99365e-03
  CSA_P1  : 1.00109e-02 ± 6.77607e-04
  CSA_P2  : -5.52596e-05 ± 1.03191e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3680', '1.800', '0.1191', '1.799', '0.0947', '7.000', '0.7069', 1, 1, 1, 1, 1733849129.049412]
VI_after__Init : ['1.201', '0.3686', '1.800', '0.1194', '1.801', '0.0873', '7.000', '0.7065', 1, 1, 1, 1, 1733849137.0726871]
VI_at__the_End : ['1.201', '0.4634', '1.800', '0.1329', '1.799', '0.1131', '7.000', '0.7072', 1, 1, 1, 1, 1733849199.5579646]