TEST_NAME : Wafer
TEST_DATE : 24_12_10-17_42_03
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-017-019-11 | FUSED_ID : 6359364768457888059
  IC_TEMP :  -59.81 | VDDM : 1117.15 | AUX_INT :   -9.30 | CsaBias :   80.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55273e-03 / 2
  ADC_P0  : -9.30343e-03 ± 2.66933e-02
  ADC_P1  : 8.20005e-03 ± 6.30714e-04
  ADC_P2  : -6.01680e-06 ± 2.95345e-06
  CSA_Chi2/NDF : 1.14971e-04 / 2
  CSA_P0  : 5.60466e-02 ± 7.15182e-03
  CSA_P1  : 9.17250e-03 ± 5.38838e-04
  CSA_P2  : -4.16602e-05 ± 8.20586e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [51]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2774', '1.800', '0.1116', '1.805', '0.1005', '7.000', '0.7070', 1, 1, 1, 1, 1733848922.8612301]
VI_after__Init : ['1.201', '0.2770', '1.800', '0.1115', '1.799', '0.0932', '7.000', '0.7064', 1, 1, 1, 1, 1733848931.0286012]
VI_at__the_End : ['1.201', '0.4666', '1.800', '0.1288', '1.800', '0.1089', '7.000', '0.7070', 1, 1, 1, 1, 1733848992.2138307]