TEST_NAME : Wafer
TEST_DATE : 24_12_10-18_09_32
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-018-012-02 | FUSED_ID : 6359364768457892034
  IC_TEMP :  -69.18 | VDDM : 1098.15 | AUX_INT :  -12.46 | CsaBias :   58.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.41991e-03 / 2
  ADC_P0  : -1.24606e-02 ± 3.34010e-02
  ADC_P1  : 8.86219e-03 ± 8.46841e-04
  ADC_P2  : -6.63759e-06 ± 4.30838e-06
  CSA_Chi2/NDF : 1.78013e-04 / 2
  CSA_P0  : 5.88465e-02 ± 8.89915e-03
  CSA_P1  : 1.04816e-02 ± 6.70487e-04
  CSA_P2  : -6.30879e-05 ± 1.02107e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2460', '1.800', '0.1270', '1.800', '0.0866', '7.000', '0.7062', 1, 1, 1, 1, 1733850571.5438473]
VI_after__Init : ['1.201', '0.2460', '1.800', '0.1265', '1.800', '0.0814', '7.000', '0.7064', 1, 1, 1, 1, 1733850579.5871317]
VI_at__the_End : ['1.201', '0.4641', '1.800', '0.1318', '1.799', '0.1114', '7.000', '0.7068', 1, 1, 1, 1, 1733850646.6789575]