TEST_NAME : Wafer
TEST_DATE : 24_12_10-18_14_40
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-018-015-02 | FUSED_ID : 6359364768457892082
  IC_TEMP :  -55.83 | VDDM : 1122.89 | AUX_INT :    0.00 | CsaBias :   80.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41785e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.66257e-02
  ADC_P1  : 8.05031e-03 ± 4.29917e-04
  ADC_P2  : -4.36116e-06 ± 2.51652e-06
  CSA_Chi2/NDF : 1.54271e-04 / 2
  CSA_P0  : 5.66834e-02 ± 8.28446e-03
  CSA_P1  : 9.66380e-03 ± 6.24174e-04
  CSA_P2  : -4.73270e-05 ± 9.50544e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [0, 84, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3546', '1.800', '0.1670', '1.800', '0.0903', '7.000', '0.7065', 1, 1, 1, 1, 1733850880.1121502]
VI_after__Init : ['1.201', '0.3545', '1.800', '0.1670', '1.800', '0.0852', '7.000', '0.7064', 1, 1, 1, 1, 1733850888.2844107]
VI_at__the_End : ['1.201', '0.4740', '1.800', '0.1321', '1.806', '0.1083', '7.000', '0.7073', 1, 1, 1, 1, 1733850949.09781]