TEST_NAME : Wafer
TEST_DATE : 24_12_10-18_16_24
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-018-016-05 | FUSED_ID : 6359364768457892101
  IC_TEMP :  -56.31 | VDDM : 1124.59 | AUX_INT :    0.00 | CsaBias :   73.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60666e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.83431e-02
  ADC_P1  : 8.16206e-03 ± 4.48053e-04
  ADC_P2  : -5.30586e-06 ± 2.59125e-06
  CSA_Chi2/NDF : 1.59525e-04 / 2
  CSA_P0  : 5.63188e-02 ± 8.42436e-03
  CSA_P1  : 9.74520e-03 ± 6.34715e-04
  CSA_P2  : -4.77533e-05 ± 9.66595e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4116', '1.800', '0.1305', '1.800', '0.0915', '7.000', '0.7065', 1, 1, 1, 1, 1733850983.9521415]
VI_after__Init : ['1.201', '0.4117', '1.800', '0.1315', '1.800', '0.0865', '7.000', '0.7065', 1, 1, 1, 1, 1733850992.2164137]
VI_at__the_End : ['1.201', '0.4796', '1.800', '0.1309', '1.799', '0.1070', '7.000', '0.7074', 1, 1, 1, 1, 1733851057.5215251]