M7DL5B0001230B2 Early breakdown -> cleaned and rearranged microcables -> fixed 42 2025-03-18 15:14:54.296078
M7DL5B1001231B2 High current during IV -> dry out -> fixed 42 2025-03-18 15:15:57.78061
M8UL0T3010603B2 p-side ENC pattern 42 2025-03-18 15:17:28.550952
M8UL0T2010602B2 p-side ENC pattern 42 2025-03-18 15:17:34.909472
M8UL0B2010602A2 p-side ENC pattern 42 2025-03-18 15:19:08.1958
M8UL0B3010603A2 p-side ENC pattern 42 2025-03-18 15:19:13.277552
M8UL0B1010601A2 High noise spread in ASIC HW_6 p-side 42 2025-03-18 15:19:39.376591
M8UL2T1010221B2 NO breakdown 42 2025-03-18 15:21:47.930837
M8UL2T1010221B2 64 broken channels (48 on p-side & 16 on n-side) 42 2025-03-18 15:22:40.362902
M8UL2T2010222B2 Dry out and rearranging of the microcables solved the breakdown 42 2025-03-18 15:26:38.035637
M8UL2T0010220B2 Drying out and rearranging the microcables solved the breakdown. 42 2025-03-18 15:28:14.78916
M8UL2T0010220B2 41 broken channels (39 on n-side & 2 on p-side) 42 2025-03-18 15:33:05.737622
M4UL2T4110314B2 Grade and sensor number needs to be added 1 2024-06-05 13:12:17.069579 GSI
M4UL4T2010322B2 This module was built wrongly. 1 2024-06-24 15:04:36.893094 GSI
M5DL1T2101162A2 Sensor changed from 10243 to 17173 1 2024-07-05 09:48:56.978386 GSI
M4UL2T4110314B2 PASSED, since every second channel is working. see meeting 3.07.2024 2 2024-10-11 15:36:58.552892
M7UL1B0010390A2 failed IV 2 2024-10-16 11:18:43.37173
M4UL0T0010550B2 a cluster of 29 broken channels in ASIC HW 5 n-side (even channels) 42 2024-10-17 10:33:26.410256
M4UL2T4110314B2 51 broken channels 42 2024-10-17 10:36:37.306562
M4DL0T2001612A2 early breakdown -> dry out -> fixed 42 2024-10-24 14:39:54.332733
M4DL0T1001611A2 early breakdown -> dry out -> fixed 42 2024-10-24 14:40:12.451392
M4DL2T2001162A2 Breakdown at 330 V-> dry out -> fixed 42 2024-10-24 14:42:32.838999
M4DL2B0001160B2 Asymmetrical current 42 2024-10-24 14:43:02.76608
M4DL2B1001161B2 Asymmetrical current, 35 broken channels 42 2024-10-24 14:43:24.194742
M4DL2B2001162B2 44 broken channels in N-side (39 of them from ASIC HW 5) 42 2024-10-24 14:44:35.931698
M4DL4T2001172A2 Short circuit between the ground plane and ground of the carrier on the n-side (red FEB) -> fixed 42 2024-10-24 14:48:08.353267
M5UL1B0010160A2 Breakdown at 370V -> dry out -> fixed 42 2024-10-24 14:54:51.248237
M5UL1B1010161A2 Asymmetrical Current 42 2024-10-24 14:55:33.209507
M5UL1B2010162A2 Asymmetrical Current 42 2024-10-24 14:55:37.053194
M5UL1B3010163A2 Asymmetrical Current 42 2024-10-24 14:55:39.403675
M5UL5T2010182B2 ASIC HW 0 (n-side) no good calibration (the applied pulse generation doesn't work) 42 2024-10-24 14:57:32.542631
M5DL1T2101162A2 Breakdown at 420V -> fixed 42 2024-10-24 15:01:06.553239
M6UL0T1010571B2 Asymmetrical current 42 2024-10-24 15:06:10.521308
M6UL0T0010570B2 Breakdown at 430 V -> dry-out -> fixed 42 2024-10-24 15:06:40.189402
M6UL0B0010570A2 Asymmetrical current 42 2024-10-24 15:06:58.965182
M6UL0B1010571A2 High noise level on ASIC HW 0 n-side -> odd channels are fine, even channels with high noise 42 2024-10-24 15:08:07.86608
M6UL0B2010572A2 High noise ASIC HW 3 (p-side) -> odd channels are fine, even channels with high noise 42 2024-10-24 15:09:22.232832
M6UL2T3010353B2 Asymmetrical current 42 2024-10-24 15:09:56.13026
M6UL2T0010350B2 Asymmetrical current 42 2024-10-24 15:10:17.659255
M6UL2B0010350A2 Asymmetrical current 42 2024-10-24 15:10:39.398978
M6UL2B1010351A2 Breakdown at 400 V -> dry out -> fixed 42 2024-10-24 15:10:54.973477
M6UL4T0010360B2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:12:36.244635
M6UL4B1010361A2 Asymmetrical current 42 2024-10-24 15:12:54.163635
M6UL4B2010362A2 Asymmetrical current 42 2024-10-24 15:12:57.577121
M6DL2T1001201A2 Asymmetrical current 42 2024-10-24 15:16:49.146456
M6DL2T0001200A2 Asymmetrical current 42 2024-10-24 15:16:51.707882
M6DL2B0001200B2 Breakdown at 350V -> dry-out -> fixed 42 2024-10-24 15:17:13.170966
M6DL4T1001201A2 Asymmetrical current 42 2024-10-24 15:18:23.873651
M6DL4T0001200A2 Asymmetrical current 42 2024-10-24 15:18:26.153647
M6DL4B0001200B2 Asymmetrical current 42 2024-10-24 15:18:28.565577
M6DL4B1001201B2 Asymmetrical current 42 2024-10-24 15:18:30.857535
M6DL4B2001202B2 Asymmetrical current 42 2024-10-24 15:18:33.565946
M6DL4B3001203B2 Asymmetrical current 42 2024-10-24 15:18:35.284114
M6DL4B4001204B2 Asymmetrical current 42 2024-10-24 15:18:37.366514
M8UL4B0010220A2 62 broken channels (45 on n-side & 17 on p-side) 42 2025-03-18 15:45:05.036777
M8UL6T2010242B2 p-side ENC pattern 42 2025-03-18 15:53:31.494923
M8UL6B2010242A2 28 broken channels 42 2025-03-18 15:58:57.311099
M3DR4T2000132B2 ASIC HW_7 p-side has higher noise level on even channels 42 2025-03-18 16:06:12.880084
M3DR4B2000132A2 p-side ENC pattern 42 2025-03-18 16:08:42.120909
M3DR4B3000133A2 p-side ENC pattern 42 2025-03-18 16:09:06.302485
M3DR6T0000150B2 p-side ENC pattern 42 2025-03-18 16:11:35.271909
M3DR6B0000150A2 Slow breakdown ~ 50V 42 2025-03-18 16:12:13.990308
M4UR1T1011311A2 p-side ENC pattern 42 2025-03-18 16:14:15.623486
M5UR0T3011563A2 p-side ENC pattern 42 2025-03-18 16:18:40.186325
M5UR6B0011190B2 High current during IV -> dry out -> fixed 42 2025-03-18 16:26:30.833939
M3DR2T4000124B2 Slow breakdown ~ 175 V -> dry out 42 2025-03-20 11:47:58.830448
M3DR2B3000123A2 p-side ENC pattern 42 2025-03-20 11:51:37.901881
M3DR2B4000124A2 p-side ENC pattern 42 2025-03-20 11:51:46.903686
M4DR1T0000160B2 Breakdown ~ 330V -> fixed 42 2025-03-20 13:55:38.142553
M3DR6B0000150A2 bad IV 10 uA, 125 V 76 2025-03-25 14:14:32.457188
M7UL3B2010392A2 does not hold 350 V, just 225 76 2025-03-25 14:27:55.842318
M7DL3B3001223B2 just reaches 250V at almost 10 uA --> fair IV --> use it 76 2025-03-25 14:39:57.065275
M5DL1B0001160B2 Bad IV during ladder test: 10 uA@85 V 7 2025-03-25 14:49:16.772825
M5DL1T0001160A2 N uplink_1 driver defect R to GND (20Ω*2) defect 7 2025-03-25 14:56:08.06446
M5DL1T1001161A2 P uplink_1 driver defect 7 2025-03-25 14:58:05.422094
M3DR2T3000123B2 p-side ENC pattern 42 2025-03-25 23:37:52.495257
M4UR5T1011331A2 p-side ENC pattern 42 2025-03-25 23:42:07.311771
M4UR5B1011331B2 p-side ENC pattern 42 2025-03-25 23:43:26.836925
M4DR1B1000161A2 29 broken channels 42 2025-03-25 23:46:16.606692
M4DR1T0000160B2 Breakdown ~ 330 V -> fixed after release of the microcables clamps 42 2025-03-25 23:48:28.1993
M4DR1T1000161B2 56 broken channels 42 2025-03-25 23:49:23.201924
M4DR1T1000161B2 56 broken channels 42 2025-03-25 23:49:23.896008
M6DL6T0001270A2 24 broken channels, from them a cluster of 13 broken channels close to the edge of ASIC HW 7 p-side 42 2024-10-24 15:19:54.195341
M6DL0T3001583A2 32 broken channels (28 of them are from ASIC HW 1 n-side) 42 2024-10-24 15:32:42.571026
M6DL0T3001583A2 32 broken channels (28 of them are from ASIC HW 1 n-side) 42 2024-10-24 15:33:22.561308
M6DL0B1001581B2 59 broken channels(44 of them in ASIC HW 7 p-side) 42 2024-10-24 15:35:16.445901
M7UL1T1010391B2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:38:17.674812
M7UL1T0010390B2 Early breakdown -> dry out -> Breakdown at 340 V -> fixed 42 2024-10-24 15:39:21.198413
M7UL1B1010391A2 Asymmetrical current -> Try to measure ENC but very high current appears -> IV measurement again, no asymmetric current, but some spike in p-side -> Measure ENC again & result is OK 42 2024-10-24 15:41:33.715876
M7UL5T2010402B2 Short circuit in N-side 42 2024-10-24 15:43:17.599906
M7UL5B1010401A2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:44:05.09027
M7UL7B0010410A2 Spike around 160V during IV, behavior as expected -> dry out because of 0.4mA at 40V during operation -> fixed 42 2024-10-24 15:45:31.730546
M7DL7T0001260A2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:47:43.591444
M7DL7B1001261B2 Slow breakdown ~ 130V -> dry-out -> Not improvement, but since the module has a sensor grade D we decided to use it in these conditions 42 2024-10-24 15:49:23.855377
M8UL0T0010600B2 Breakdown ~ 420 V -> dry out -> fixed & 33 broken channels (10 on n-side and 23 on p-side) 42 2024-11-25 17:38:29.15606
M5UR0T2011562A2 module was build at GSI. 5 2024-11-28 10:57:47.756473
M6UL4T3110363B2 36 broken channels (8 on n-side and 28 on p-side, 22 of them consecutive) 42 2024-12-09 23:01:40.252157
M7UL1T0010390B2 Early breakdown ~ 5V -> dry out -> fixed 42 2024-12-17 21:55:46.155293
M7DL3T3001223A2 Slow breakdown ~ 120 V 42 2024-12-17 22:00:33.934351
M7DL3B3001223B2 Slow breakdown ~ 150 V 42 2024-12-17 22:01:32.176964
M7UL1B0110390A2 35 broken channels on n-side and 34 broken channels on p-side (69 in total) 42 2025-01-14 10:48:01.683397
M3DR0B1000541A2 Slow breakdown ~ 350V ( ~ 3uA at 500 V) 42 2025-01-27 08:46:02.730437
M8UL2T2010222B2 Sharp breakdown at 375V (Optical grade A) 77 2025-02-11 11:27:43.657608
M8UL2T1010221B2 Sharp breakdown at 375V (Optical grade A) 77 2025-02-11 11:28:01.26966
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:28:38.649548
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:29:33.573354
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:30:22.158148
M8UL2T2010222B2 presented by Anju on 12.02.2025 --> breakdown at > 350 V --> maybe class B (from A) 76 2025-02-13 13:37:13.883163
M4UR1T2011312A2 presented by Anju 12.02.2025 current breakdown at 350V, required grade: A 76 2025-02-13 13:41:23.567501
M8UL2T0010220B2 reported by Anju on 12.02.2025 passed with errors: M8UL2T0010220B2 Reason: 41 broken channels (39 on n-side and 2 on p-side) but current breakthrough at 370 V 76 2025-02-13 13:51:38.473179
M8UL2T0010220B2 presented by Anju on 22.01.2025 current increase from 100 V, does not reach 200 V 76 2025-02-13 14:17:15.728269
M7DL3B3001223B2 current rises from 150 V to just below 10 uA at 250V required class C, seems just to reach C 76 2025-02-13 14:22:28.879513
M8UL2T2010222B2 B but required A 76 2025-02-13 14:25:38.899943
M0DR3T4000104B2 test 1 2025-02-14 10:11:08.25086
M7DL3T3001223A2 required C, but does not reach 200 V 76 2025-02-14 13:12:48.626362
M0DR3T4000104B2 test update 1 2025-02-14 13:55:02.701038
M0DR3T4000104B2 upgrade done 1 2025-02-14 16:58:54.674181
M5UR0B3011563B2 IV grade C still acceptable. Thus to be used. 76 2025-02-24 10:47:09.260675
M4DR3B1000171A2 New sensor 15193 assigned due to scratch on old sensor with id 08063 1 2025-02-27 15:41:20.998386
M0DR3T4000104B2 new version with search 1 2025-03-04 22:24:23.017326
M0DR3T4000104B2 test of March 6th 1 2025-03-06 17:23:17.89072
M0DR3T4000104B2 Christian irakli test 1 2025-03-07 16:25:30.985943
M0DR3T4000104B2 back to 10 status 1 2025-03-07 16:32:09.859322
M4DL0T3001613A2 Noisy channels in ASIC HW 7 and 6 p-side 42 2025-03-18 13:53:47.746722
M4DL0B3101613B2 p-side ENC pattern -> Fixed 42 2025-03-18 14:00:15.333284
M4DL4T3001173A2 p-side ENC pattern 42 2025-03-18 14:18:43.146653
M4DL4B3001173B2 p-side ENC pattern 42 2025-03-18 14:27:35.273182
M4DL6B1001191B2 p-side ENC pattern 42 2025-03-18 14:28:25.667557
M5UL5T0010180B2 p-side ENC pattern 42 2025-03-18 14:30:57.944421
M5DL3B3001173B2 p-side ENC pattern 42 2025-03-18 14:32:08.48504
M6UL4B3010363A2 ENC pattern 42 2025-03-18 14:36:41.675812
M6DL0T4001584A2 p-side ENC pattern 42 2025-03-18 14:37:40.590206
M6DL0T2001582A2 p-side ENC pattern 42 2025-03-18 14:38:30.38897
M6DL0B2001582B2 p-side ENC pattern 42 2025-03-18 14:39:11.105358
M6DL0B4001584B2 p-side ENC pattern 42 2025-03-18 14:39:37.417268
M6DL2B2001202B2 p-side ENC pattern 42 2025-03-18 14:41:08.964232
M6DL2B4001204B2 p-side ENC pattern 42 2025-03-18 14:41:20.427988
M6DL4T0001200A2 NO asymmetrical current 42 2025-03-18 14:43:58.517215
M6DL4B0001200B2 NO asymmetrical current 42 2025-03-18 14:44:03.123002
M6DL4B1001201B2 NO asymmetrical current 42 2025-03-18 14:44:06.177874
M6DL4B2001202B2 NO asymmetrical current 42 2025-03-18 14:44:09.033857
M6DL4B3001203B2 NO asymmetrical current 42 2025-03-18 14:44:11.093904
M6DL4B4001204B2 NO asymmetrical current 42 2025-03-18 14:44:13.389361
M6DL4B4001204B2 p-side ENC pattern 42 2025-03-18 14:44:33.690064
M7UL3T4010394B2 Two ASICs in n-side HW_4 and HW_6 with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:48:11.726934
M7UL3T2010392B2 High current during IV and calibration ~ 5uA 42 2025-03-18 14:49:20.370871
M7UL3T1010391B2 Breakdown ~ 450 V 42 2025-03-18 14:50:09.384608
M7UL3T0010390B2 All ASICs except HW_1 n-side with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:52:00.11015
M7UL3B0010390A2 All ASICs p-side with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:52:45.690162
M7UL3B1010391A2 Slow breakdown ~ 475 V 42 2025-03-18 14:53:37.619635
M7UL3B2010392A2 Slow breakdown ~ 125 V 42 2025-03-18 14:54:27.242753
M7DL1T4001224A2 p-side ENC pattern 42 2025-03-18 15:00:43.662361
M7DL1B4001224B2 p-side ENC pattern 42 2025-03-18 15:01:22.687196
M7DL3T1001221A2 p-side ENC pattern 42 2025-03-18 15:09:00.524309
M7DL3T0001220A2 Multiple ASICs with the same E-fuse ID 42 2025-03-18 15:09:52.32503
M7DL3B0001220B2 37 broken channels (36 on n-side & 1 on p-side) 42 2025-03-18 15:11:21.463068
M7DL3B4001224B2 ENC pattern 42 2025-03-18 15:12:25.096061
M7DL5T4001234A2 High leakage current -> fixed 42 2025-03-18 15:13:24.340023
M8UL2T3010223B2 ENC pattern 42 2025-03-18 15:20:29.551162
M5UR4B0011170B2 Repaired in CL 7 2025-04-02 09:09:33.054151
M5DL1T2101162A2 Removed from Ladder; To be used 7 2025-04-04 09:08:25.147208
M5DL1T3001163A2 Removed from Ladder; To be used 7 2025-04-04 09:10:18.941953
M5DL1T4001164A2 Removed from Ladder; To be used 7 2025-04-04 09:10:52.695638
M4DR1B3000163A2 39 broken channels 42 2025-04-04 15:04:17.665993
M4DR1B4000164A2 p-side ENC pattern 42 2025-04-04 15:05:01.166133
M4DR3T3000173B2 Early breakdown -> fixed by removing microcable clamps p-side ENC pattern 42 2025-04-04 15:07:59.071744
M4DR3T0000170B2 p-side ENC pattern 42 2025-04-04 15:10:05.106759
M5DL1B0101160B2 Module created 1 2025-04-16 16:07:44.817034
M5DL1T0101160A2 Module created 1 2025-04-16 16:08:57.568855
M5DL1T1101161A2 Module created 1 2025-04-16 16:10:27.543354
M5DR2T1100161B2 Module created 76 2025-04-25 11:15:20.178697
M5DR2T1000161B2 old sensor ID restored 76 2025-04-25 11:10:00 GSI
M5DR2T1000161B2 By J.H.s request, the sensor has been updated to M5DR2T1000161B2 -> 03422 1 2025-04-08 11:03:52.992359 GSI