M7DL5B0001230B2 Early breakdown -> cleaned and rearranged microcables -> fixed 42 2025-03-18 15:14:54.296078
M7DL5B1001231B2 High current during IV -> dry out -> fixed 42 2025-03-18 15:15:57.78061
M8UL0T3010603B2 p-side ENC pattern 42 2025-03-18 15:17:28.550952
M8UL0T2010602B2 p-side ENC pattern 42 2025-03-18 15:17:34.909472
M8UL0B2010602A2 p-side ENC pattern 42 2025-03-18 15:19:08.1958
M8UL0B3010603A2 p-side ENC pattern 42 2025-03-18 15:19:13.277552
M8UL0B1010601A2 High noise spread in ASIC HW_6 p-side 42 2025-03-18 15:19:39.376591
M8UL2T1010221B2 NO breakdown 42 2025-03-18 15:21:47.930837
M8UL2T1010221B2 64 broken channels (48 on p-side & 16 on n-side) 42 2025-03-18 15:22:40.362902
M8UL2T2010222B2 Dry out and rearranging of the microcables solved the breakdown 42 2025-03-18 15:26:38.035637
M8UL2T0010220B2 Drying out and rearranging the microcables solved the breakdown. 42 2025-03-18 15:28:14.78916
M8UL2T0010220B2 41 broken channels (39 on n-side & 2 on p-side) 42 2025-03-18 15:33:05.737622
M4UL2T4110314B2 Grade and sensor number needs to be added 1 2024-06-05 13:12:17.069579 GSI
M4UL4T2010322B2 This module was built wrongly. 1 2024-06-24 15:04:36.893094 GSI
M5DL1T2101162A2 Sensor changed from 10243 to 17173 1 2024-07-05 09:48:56.978386 GSI
M4UL2T4110314B2 PASSED, since every second channel is working. see meeting 3.07.2024 2 2024-10-11 15:36:58.552892
M7UL1B0010390A2 failed IV 2 2024-10-16 11:18:43.37173
M4UL0T0010550B2 a cluster of 29 broken channels in ASIC HW 5 n-side (even channels) 42 2024-10-17 10:33:26.410256
M4UL2T4110314B2 51 broken channels 42 2024-10-17 10:36:37.306562
M4DL0T2001612A2 early breakdown -> dry out -> fixed 42 2024-10-24 14:39:54.332733
M4DL0T1001611A2 early breakdown -> dry out -> fixed 42 2024-10-24 14:40:12.451392
M4DL2T2001162A2 Breakdown at 330 V-> dry out -> fixed 42 2024-10-24 14:42:32.838999
M4DL2B0001160B2 Asymmetrical current 42 2024-10-24 14:43:02.76608
M4DL2B1001161B2 Asymmetrical current, 35 broken channels 42 2024-10-24 14:43:24.194742
M4DL2B2001162B2 44 broken channels in N-side (39 of them from ASIC HW 5) 42 2024-10-24 14:44:35.931698
M4DL4T2001172A2 Short circuit between the ground plane and ground of the carrier on the n-side (red FEB) -> fixed 42 2024-10-24 14:48:08.353267
M5UL1B0010160A2 Breakdown at 370V -> dry out -> fixed 42 2024-10-24 14:54:51.248237
M5UL1B1010161A2 Asymmetrical Current 42 2024-10-24 14:55:33.209507
M5UL1B2010162A2 Asymmetrical Current 42 2024-10-24 14:55:37.053194
M5UL1B3010163A2 Asymmetrical Current 42 2024-10-24 14:55:39.403675
M5UL5T2010182B2 ASIC HW 0 (n-side) no good calibration (the applied pulse generation doesn't work) 42 2024-10-24 14:57:32.542631
M5DL1T2101162A2 Breakdown at 420V -> fixed 42 2024-10-24 15:01:06.553239
M6UL0T1010571B2 Asymmetrical current 42 2024-10-24 15:06:10.521308
M6UL0T0010570B2 Breakdown at 430 V -> dry-out -> fixed 42 2024-10-24 15:06:40.189402
M6UL0B0010570A2 Asymmetrical current 42 2024-10-24 15:06:58.965182
M6UL0B1010571A2 High noise level on ASIC HW 0 n-side -> odd channels are fine, even channels with high noise 42 2024-10-24 15:08:07.86608
M6UL0B2010572A2 High noise ASIC HW 3 (p-side) -> odd channels are fine, even channels with high noise 42 2024-10-24 15:09:22.232832
M6UL2T3010353B2 Asymmetrical current 42 2024-10-24 15:09:56.13026
M6UL2T0010350B2 Asymmetrical current 42 2024-10-24 15:10:17.659255
M6UL2B0010350A2 Asymmetrical current 42 2024-10-24 15:10:39.398978
M6UL2B1010351A2 Breakdown at 400 V -> dry out -> fixed 42 2024-10-24 15:10:54.973477
M6UL4T0010360B2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:12:36.244635
M6UL4B1010361A2 Asymmetrical current 42 2024-10-24 15:12:54.163635
M6UL4B2010362A2 Asymmetrical current 42 2024-10-24 15:12:57.577121
M6DL2T1001201A2 Asymmetrical current 42 2024-10-24 15:16:49.146456
M6DL2T0001200A2 Asymmetrical current 42 2024-10-24 15:16:51.707882
M6DL2B0001200B2 Breakdown at 350V -> dry-out -> fixed 42 2024-10-24 15:17:13.170966
M6DL4T1001201A2 Asymmetrical current 42 2024-10-24 15:18:23.873651
M6DL4T0001200A2 Asymmetrical current 42 2024-10-24 15:18:26.153647
M6DL4B0001200B2 Asymmetrical current 42 2024-10-24 15:18:28.565577
M6DL4B1001201B2 Asymmetrical current 42 2024-10-24 15:18:30.857535
M6DL4B2001202B2 Asymmetrical current 42 2024-10-24 15:18:33.565946
M6DL4B3001203B2 Asymmetrical current 42 2024-10-24 15:18:35.284114
M6DL4B4001204B2 Asymmetrical current 42 2024-10-24 15:18:37.366514
M8UL4B0010220A2 62 broken channels (45 on n-side & 17 on p-side) 42 2025-03-18 15:45:05.036777
M8UL6T2010242B2 p-side ENC pattern 42 2025-03-18 15:53:31.494923
M8UL6B2010242A2 28 broken channels 42 2025-03-18 15:58:57.311099
M3DR4T2000132B2 ASIC HW_7 p-side has higher noise level on even channels 42 2025-03-18 16:06:12.880084
M3DR4B2000132A2 p-side ENC pattern 42 2025-03-18 16:08:42.120909
M3DR4B3000133A2 p-side ENC pattern 42 2025-03-18 16:09:06.302485
M3DR6T0000150B2 p-side ENC pattern 42 2025-03-18 16:11:35.271909
M3DR6B0000150A2 Slow breakdown ~ 50V 42 2025-03-18 16:12:13.990308
M4UR1T1011311A2 p-side ENC pattern 42 2025-03-18 16:14:15.623486
M5UR0T3011563A2 p-side ENC pattern 42 2025-03-18 16:18:40.186325
M5UR6B0011190B2 High current during IV -> dry out -> fixed 42 2025-03-18 16:26:30.833939
M3DR2T4000124B2 Slow breakdown ~ 175 V -> dry out 42 2025-03-20 11:47:58.830448
M3DR2B3000123A2 p-side ENC pattern 42 2025-03-20 11:51:37.901881
M3DR2B4000124A2 p-side ENC pattern 42 2025-03-20 11:51:46.903686
M4DR1T0000160B2 Breakdown ~ 330V -> fixed 42 2025-03-20 13:55:38.142553
M3DR6B0000150A2 bad IV 10 uA, 125 V 76 2025-03-25 14:14:32.457188
M7UL3B2010392A2 does not hold 350 V, just 225 76 2025-03-25 14:27:55.842318
M7DL3B3001223B2 just reaches 250V at almost 10 uA --> fair IV --> use it 76 2025-03-25 14:39:57.065275
M5DL1B0001160B2 Bad IV during ladder test: 10 uA@85 V 7 2025-03-25 14:49:16.772825
M5DL1T0001160A2 N uplink_1 driver defect R to GND (20Ω*2) defect 7 2025-03-25 14:56:08.06446
M5DL1T1001161A2 P uplink_1 driver defect 7 2025-03-25 14:58:05.422094
M3DR2T3000123B2 p-side ENC pattern 42 2025-03-25 23:37:52.495257
M4UR5T1011331A2 p-side ENC pattern 42 2025-03-25 23:42:07.311771
M4UR5B1011331B2 p-side ENC pattern 42 2025-03-25 23:43:26.836925
M4DR1B1000161A2 29 broken channels 42 2025-03-25 23:46:16.606692
M4DR1T0000160B2 Breakdown ~ 330 V -> fixed after release of the microcables clamps 42 2025-03-25 23:48:28.1993
M4DR1T1000161B2 56 broken channels 42 2025-03-25 23:49:23.201924
M4DR1T1000161B2 56 broken channels 42 2025-03-25 23:49:23.896008
M8UL2T1010221B2 fix DB 7 2025-10-07 09:18:11.023803 GSI
M6DL6T0001270A2 24 broken channels, from them a cluster of 13 broken channels close to the edge of ASIC HW 7 p-side 42 2024-10-24 15:19:54.195341
M6DL0T3001583A2 32 broken channels (28 of them are from ASIC HW 1 n-side) 42 2024-10-24 15:32:42.571026
M6DL0T3001583A2 32 broken channels (28 of them are from ASIC HW 1 n-side) 42 2024-10-24 15:33:22.561308
M6DL0B1001581B2 59 broken channels(44 of them in ASIC HW 7 p-side) 42 2024-10-24 15:35:16.445901
M7UL1T1010391B2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:38:17.674812
M7UL1T0010390B2 Early breakdown -> dry out -> Breakdown at 340 V -> fixed 42 2024-10-24 15:39:21.198413
M7UL1B1010391A2 Asymmetrical current -> Try to measure ENC but very high current appears -> IV measurement again, no asymmetric current, but some spike in p-side -> Measure ENC again & result is OK 42 2024-10-24 15:41:33.715876
M7UL5T2010402B2 Short circuit in N-side 42 2024-10-24 15:43:17.599906
M7UL5B1010401A2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:44:05.09027
M7UL7B0010410A2 Spike around 160V during IV, behavior as expected -> dry out because of 0.4mA at 40V during operation -> fixed 42 2024-10-24 15:45:31.730546
M7DL7T0001260A2 Early breakdown -> dry out -> fixed 42 2024-10-24 15:47:43.591444
M7DL7B1001261B2 Slow breakdown ~ 130V -> dry-out -> Not improvement, but since the module has a sensor grade D we decided to use it in these conditions 42 2024-10-24 15:49:23.855377
M8UL0T0010600B2 Breakdown ~ 420 V -> dry out -> fixed & 33 broken channels (10 on n-side and 23 on p-side) 42 2024-11-25 17:38:29.15606
M5UR0T2011562A2 module was build at GSI. 5 2024-11-28 10:57:47.756473
M6UL4T3110363B2 36 broken channels (8 on n-side and 28 on p-side, 22 of them consecutive) 42 2024-12-09 23:01:40.252157
M7UL1T0010390B2 Early breakdown ~ 5V -> dry out -> fixed 42 2024-12-17 21:55:46.155293
M7DL3T3001223A2 Slow breakdown ~ 120 V 42 2024-12-17 22:00:33.934351
M7DL3B3001223B2 Slow breakdown ~ 150 V 42 2024-12-17 22:01:32.176964
M7UL1B0110390A2 35 broken channels on n-side and 34 broken channels on p-side (69 in total) 42 2025-01-14 10:48:01.683397
M3DR0B1000541A2 Slow breakdown ~ 350V ( ~ 3uA at 500 V) 42 2025-01-27 08:46:02.730437
M8UL2T2010222B2 Sharp breakdown at 375V (Optical grade A) 77 2025-02-11 11:27:43.657608
M8UL2T1010221B2 Sharp breakdown at 375V (Optical grade A) 77 2025-02-11 11:28:01.26966
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:28:38.649548
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:29:33.573354
M8UL2T2010222B2 Sharp breakdown at 370V 77 2025-02-11 11:30:22.158148
M8UL2T2010222B2 presented by Anju on 12.02.2025 --> breakdown at > 350 V --> maybe class B (from A) 76 2025-02-13 13:37:13.883163
M4UR1T2011312A2 presented by Anju 12.02.2025 current breakdown at 350V, required grade: A 76 2025-02-13 13:41:23.567501
M8UL2T0010220B2 reported by Anju on 12.02.2025 passed with errors: M8UL2T0010220B2 Reason: 41 broken channels (39 on n-side and 2 on p-side) but current breakthrough at 370 V 76 2025-02-13 13:51:38.473179
M8UL2T0010220B2 presented by Anju on 22.01.2025 current increase from 100 V, does not reach 200 V 76 2025-02-13 14:17:15.728269
M7DL3B3001223B2 current rises from 150 V to just below 10 uA at 250V required class C, seems just to reach C 76 2025-02-13 14:22:28.879513
M8UL2T2010222B2 B but required A 76 2025-02-13 14:25:38.899943
M7DL3T3001223A2 required C, but does not reach 200 V 76 2025-02-14 13:12:48.626362
M5UR0B3011563B2 IV grade C still acceptable. Thus to be used. 76 2025-02-24 10:47:09.260675
M4DR3B1000171A2 New sensor 15193 assigned due to scratch on old sensor with id 08063 1 2025-02-27 15:41:20.998386
M4DL0T3001613A2 Noisy channels in ASIC HW 7 and 6 p-side 42 2025-03-18 13:53:47.746722
M4DL0B3101613B2 p-side ENC pattern -> Fixed 42 2025-03-18 14:00:15.333284
M4DL4T3001173A2 p-side ENC pattern 42 2025-03-18 14:18:43.146653
M4DL4B3001173B2 p-side ENC pattern 42 2025-03-18 14:27:35.273182
M4DL6B1001191B2 p-side ENC pattern 42 2025-03-18 14:28:25.667557
M5UL5T0010180B2 p-side ENC pattern 42 2025-03-18 14:30:57.944421
M5DL3B3001173B2 p-side ENC pattern 42 2025-03-18 14:32:08.48504
M6UL4B3010363A2 ENC pattern 42 2025-03-18 14:36:41.675812
M6DL0T4001584A2 p-side ENC pattern 42 2025-03-18 14:37:40.590206
M6DL0T2001582A2 p-side ENC pattern 42 2025-03-18 14:38:30.38897
M6DL0B2001582B2 p-side ENC pattern 42 2025-03-18 14:39:11.105358
M6DL0B4001584B2 p-side ENC pattern 42 2025-03-18 14:39:37.417268
M6DL2B2001202B2 p-side ENC pattern 42 2025-03-18 14:41:08.964232
M6DL2B4001204B2 p-side ENC pattern 42 2025-03-18 14:41:20.427988
M6DL4T0001200A2 NO asymmetrical current 42 2025-03-18 14:43:58.517215
M6DL4B0001200B2 NO asymmetrical current 42 2025-03-18 14:44:03.123002
M6DL4B1001201B2 NO asymmetrical current 42 2025-03-18 14:44:06.177874
M6DL4B2001202B2 NO asymmetrical current 42 2025-03-18 14:44:09.033857
M6DL4B3001203B2 NO asymmetrical current 42 2025-03-18 14:44:11.093904
M6DL4B4001204B2 NO asymmetrical current 42 2025-03-18 14:44:13.389361
M6DL4B4001204B2 p-side ENC pattern 42 2025-03-18 14:44:33.690064
M7UL3T4010394B2 Two ASICs in n-side HW_4 and HW_6 with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:48:11.726934
M7UL3T2010392B2 High current during IV and calibration ~ 5uA 42 2025-03-18 14:49:20.370871
M7UL3T1010391B2 Breakdown ~ 450 V 42 2025-03-18 14:50:09.384608
M7UL3T0010390B2 All ASICs except HW_1 n-side with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:52:00.11015
M7UL3B0010390A2 All ASICs p-side with the same E-fuse ID (XA-000-08-003-000-006-051-08) 42 2025-03-18 14:52:45.690162
M7UL3B1010391A2 Slow breakdown ~ 475 V 42 2025-03-18 14:53:37.619635
M7UL3B2010392A2 Slow breakdown ~ 125 V 42 2025-03-18 14:54:27.242753
M7DL1T4001224A2 p-side ENC pattern 42 2025-03-18 15:00:43.662361
M7DL1B4001224B2 p-side ENC pattern 42 2025-03-18 15:01:22.687196
M7DL3T1001221A2 p-side ENC pattern 42 2025-03-18 15:09:00.524309
M7DL3T0001220A2 Multiple ASICs with the same E-fuse ID 42 2025-03-18 15:09:52.32503
M7DL3B0001220B2 37 broken channels (36 on n-side & 1 on p-side) 42 2025-03-18 15:11:21.463068
M7DL3B4001224B2 ENC pattern 42 2025-03-18 15:12:25.096061
M7DL5T4001234A2 High leakage current -> fixed 42 2025-03-18 15:13:24.340023
M8UL2T3010223B2 ENC pattern 42 2025-03-18 15:20:29.551162
M5UR4B0011170B2 Repaired in CL 7 2025-04-02 09:09:33.054151
M5DL1T2101162A2 Removed from Ladder; To be used 7 2025-04-04 09:08:25.147208
M5DL1T3001163A2 Removed from Ladder; To be used 7 2025-04-04 09:10:18.941953
M5DL1T4001164A2 Removed from Ladder; To be used 7 2025-04-04 09:10:52.695638
M4DR1B3000163A2 39 broken channels 42 2025-04-04 15:04:17.665993
M4DR1B4000164A2 p-side ENC pattern 42 2025-04-04 15:05:01.166133
M4DR3T3000173B2 Early breakdown -> fixed by removing microcable clamps p-side ENC pattern 42 2025-04-04 15:07:59.071744
M4DR3T0000170B2 p-side ENC pattern 42 2025-04-04 15:10:05.106759
M5DL1B0101160B2 Module created 1 2025-04-16 16:07:44.817034
M5DL1T0101160A2 Module created 1 2025-04-16 16:08:57.568855
M5DL1T1101161A2 Module created 1 2025-04-16 16:10:27.543354
M5DR2T1100161B2 Module created 76 2025-04-25 11:15:20.178697
M5DR2T1000161B2 old sensor ID restored 76 2025-04-25 11:10:00 GSI
M5DR2T1000161B2 By J.H.s request, the sensor has been updated to M5DR2T1000161B2 -> 03422 1 2025-04-08 11:03:52.992359 GSI
M7UL3T3010393B2 pending (recorded by Patryck Semeniuk) 76 2025-04-28 14:54:05.263301
M6UL6B0010380A2 Fix Status in DB 7 2025-04-28 15:10:47.862023
M4UR1B1011311B2 Very slow breakdown is starting at ~475V; At 500V leakage current value = 1,5 uA 42 2025-04-29 10:14:15.138206
M4UR1B1011311B2 Very slow breakdown is starting at ~475V; At 500V leakage current value = 1,5 uA 42 2025-04-29 10:31:40.975809
M4UR3T4011314A2 p-side ENC pattern 42 2025-04-29 10:35:25.748471
M5UR2T4011164A2 Ohmic behaviour, leakage current value = 1,4 uA at 250V 42 2025-04-29 10:41:42.779861
M5UR2B0011160B2 Little asymmetric current for p- and n-side 42 2025-04-29 10:43:36.678508
M5UR2B3011163B2 Ohmic behavior, leakage current value = 6.5 μA at 350 V. Higher ENC level on p-side ASIC HW address 0 42 2025-04-29 10:45:14.351221
M3DR4T0000130B2 P-side shielding is broken, needs to be re-mounted 42 2025-05-07 11:44:14.560355
M4DR5B2000182A2 Broken sensor, clean cut 42 2025-05-14 09:41:26.865918
M4DL4T2001172A2 10 uA @ 4V after Ladder assembly. Removed from ladder. 7 2025-05-20 21:46:43.158952
M4DL4B2001172B2 10 uA @ 4V after Ladder assembly. Removed from ladder. 7 2025-05-20 21:49:58.459183
M5DR0B3000563A2 36 broken channels on the n-side 42 2025-05-20 23:53:32.049454
M3DL3T4001124A2 Soft breakdown 7 2025-05-23 09:59:09.780532
M3DL5B0001140B2 Soft breakdown 7 2025-05-23 09:59:51.153266
M3DL5B0001140B2 Hard breakdown at various voltages 7 2025-05-23 10:01:06.878925
M4DL0B3001613B2 Soft breakdown 7 2025-05-23 10:01:35.85718
M4UL2T3010313B2 Hard breakdown@450 V. New grade B 7 2025-05-23 10:02:52.6934
M4UL2T4010314B2 Soft breakdown 7 2025-05-23 10:03:25.775279
M5UL3T0010170B2 High ohmic (parallel) current 7 2025-05-23 10:09:09.581756
M6UL0B3010573A2 Breakdown @15V 7 2025-05-23 10:09:54.119001
M6UL0B3010573A2 After storage in cleanroom: Breakdown @ 55V 7 2025-05-23 10:11:25.296398
M6UL0B3010573A2 After measurement up to 15 uA and 14h @ 200V: Grade C (7.5 uA@250V) 7 2025-05-23 10:12:51.129782
M6UL4T3010363B2 High ohmic (parallel) current 7 2025-05-23 10:13:48.095241
M7UL1B0010390A2 Hard breakdown@325 V: New grade C 7 2025-05-23 10:15:06.564349
M7DL3T3001223A2 Soft breakdown 7 2025-05-23 10:20:56.212624
M5DL1T0001160A2 Failed during ladder test: Short between T0 and T1. 7 2025-05-23 10:22:47.492593
M5DL1T1001161A2 Failed during ladder test: Short between T0 and T1. 7 2025-05-23 10:23:27.595331
M4DR5B2000182A2 Fixed status in db; Sensor broken before start of module test. 7 2025-05-23 10:31:19.869938
M3DL5B0001140B2 ERRATUM: Soft breakdown 7 2025-05-23 10:34:20.832157
M5DL1T2001162A2 High ohmic (parallel) current 7 2025-05-23 10:36:14.069842
M4DL0B1001611B2 Hard breakdown at various voltages 7 2025-05-23 10:37:25.483918
M4UL6T0010340B2 This module was built wrongly. 7 2025-05-23 10:38:58.713639
M5DR2T1000161B2 This module was built wrongly. 7 2025-05-23 10:39:46.912314
M6UL6B0010380A2 This module was built wrongly. 7 2025-05-23 10:41:05.730671
M5DR4T3000173B2 41 broken channels (32 on the p-side and 9 on the n-side) 42 2025-06-11 11:09:57.902958 GSI
M5UR2T3011163A2 Not smooth IV 42 2025-06-17 15:20:10.912634 GSI
M5DR0T1000561B2 ASIC 6 p-side, issues with calibration -> every four channels, the internal pulse generator is not working 42 2025-06-17 15:33:38.76449 GSI
M4UR1T2011312A2 This module has been exchanged with M4UR3T2011312A2 1 2025-06-25 13:55:16.445733 GSI
M4UR3T2011312A2 This module has been exchanged with M4UR1T2011312A2 1 2025-06-25 13:55:42.764994 GSI
M6DL4B0001200B2 First 22mm sensor on ladder 7 2025-06-25 14:48:42.031667 GSI
M4UR3T2011312A2 holds 340V -- accepted as grade B 76 2025-06-26 13:47:37.302334 GSI
M4UR1T2011312A2 passed - grade A 76 2025-06-26 13:49:35.432048 GSI
M4DL4T2101172A2 Module created 76 2025-06-26 13:55:26.05136 GSI
M4DR5B2100182A2 Module created 76 2025-06-26 13:57:47.790942 GSI
M3DR6B0100150A2 Module created 76 2025-06-26 15:12:01.889067 GSI
M7UL3B2110392A2 Module created 76 2025-06-26 15:13:32.389024 GSI
M5UR2B4011164B2 Early breakdown 42 2025-07-01 11:15:08.983669 GSI
M6UR1T4011354A2 early breakdown -> dry out 42 2025-07-01 11:42:17.441815 GSI
M6UR1T3011353A2 early breakdown -> dry out 42 2025-07-01 11:42:27.553053 GSI
M6UR1T2011352A2 Breakdown ~ 440V -> dry out -> fixed 42 2025-07-01 11:45:31.831552 GSI
M6UR1T0011350A2 Breakdown ~ 480 V -> dry out 42 2025-07-01 11:52:25.984307 GSI
M6UR1B3011353B2 Early breakdown 42 2025-07-01 11:55:26.829577 GSI
M6UR1B2011352B2 asymmetric current 42 2025-07-01 11:57:17.231136 GSI
M6UR3T2011362A2 ohmic behavior 42 2025-07-01 13:37:11.090308 GSI
M6UR3B3011363B2 ohmic behavior 42 2025-07-01 13:38:25.927543 GSI
M5DR6T0000190B2 Uplinks on n-side are missing, reported on 18 June 2025. Most likely an LV over-voltage to FEB happened during testing. 76 2025-07-01 14:02:04.160235 GSI
M4DR5T0000180B2 Uplinks are missing, reported on 18 June 2025. Most likely an LV over-voltage to FEB happened during testing. 76 2025-07-01 14:03:18.485443 GSI
M5DR0T2000562B2 Uplinks are missing, reported on 18 June 2025. Most likely an LV over-voltage to FEB happened during testing. 76 2025-07-01 14:04:02.780394 GSI
M5DR6T0000190B2 Actually: Human mistake in handling during final acceptance test 76 2025-07-02 10:28:32.281941 GSI
M6UR3B0011360B2 asymmetric current 42 2025-06-01 13:39:04 GSI
M4DR5T0000180B2 Actually: Human mistake in handling during final acceptance test 76 2025-07-02 10:29:37.492435 GSI
M5DR0T2000562B2 Actually: Human mistake in handling during final acceptance test 76 2025-07-02 10:30:12.802124 GSI
M7UL3T3010393B2 sensor holds almost 250V, at 10 uA, thus is considered as good for the required grade C. 76 2025-07-02 10:35:34.978885 GSI
M6UR1T0011350A2 Slow breakdown ~ 480V -> @ 500V ~ 0.6 uA 42 2025-07-03 13:51:57.001178 GSI
M6UR3B3011363B2 Ohmic parallel currents 42 2025-07-03 14:01:39.891034 GSI
M5DR0T2100562B2 Module created 76 2025-07-04 10:18:12.5764 GSI
M5DR6T0100190B2 Module created 76 2025-07-04 10:20:36.297486 GSI
M4DR5T0100180B2 Module created 76 2025-07-04 10:22:14.499439 GSI
M6UR3T3011363A2 Early breakdown/ High leakage current (18 uA at the Start of Tests) -> 12 uA at the End of the Test 42 2025-07-14 10:27:59.169819 GSI
M6UR5T2011372A2 High current ~ 27uA at 150 V 42 2025-07-14 10:52:30.3334 GSI
M7UR2B4011394B2 High leakage current on measuring day (60 uA at the start of the test), 31 uA at the end of the test 42 2025-07-14 11:25:47.641043 GSI
M7UR6T0011260A2 Current fluctuations between 60 and 80 V 42 2025-07-14 11:34:52.982465 GSI
M5DR2B3000163A2 ASIC HW 7 on n- and p-side. Indicious of the pulse generator not working in the p-side 42 2025-07-14 11:38:54.4848 GSI
M8UR7B1011261B2 High current ~ 45uA at 150V 42 2025-07-14 11:47:39.044604 GSI
M8UR7T0011260A2 High current ~ 40 uA at 150 V 42 2025-07-14 11:51:00.316008 GSI
M6UR1B3011353B2 High current ~ 15 uA @ 150 V. Rising current @ 340 V. It reached the 350 V with I = 42 uA 42 2025-07-15 18:16:59.985248 GSI
M6UR1B4011354B2 High current ~ 32 uA @ 150V. Current fluctuations from 210 - 250 V. 42 2025-07-15 18:23:37.658421 GSI
M6UR3T2011362A2 High current with large fluctuations. Stable curve from 170 - 315 V. i = 8uA @ 150V 42 2025-07-15 18:29:32.649322 GSI
M6UR5B1011371B2 High current ~ 50 uA @ 150 V 42 2025-07-15 18:32:44.525018 GSI
M6DR5B2000252A2 Every four channels of ASIC HW_1 p-side are very noisy 42 2025-07-15 18:40:47.010494 GSI
M7UR2B2011392B2 Current fluctuations with spike at 60 V -> Bias run overnight -> No spike, but a bit higher current from 0 - 60 V 35 broken channels (34 in n-side and one on p-side) 42 2025-07-15 18:50:42.923557 GSI
M5UR2B4011164B2 ??? pending? 76 2025-07-18 16:21:13.276234 GSI
M5UR2B4111164B2 Module created 76 2025-07-18 16:25:37.803746 GSI
M7UR6B0011260B2 Sensor corner damaged during test/handling 76 2025-07-18 16:35:38.112862 GSI
M7UR6B0111260B2 Module created 76 2025-07-18 16:38:33.567196 GSI
M6DL0B4101584B2 Module created 76 2025-07-18 16:44:23.696599 GSI
M0DR3T4000104B2 aaa 1 2025-07-21 11:44:31.787366 GSI
M6DR3T0000200B2 Breakdown at 470V. It reaches 500V with i = 12uA 42 2025-07-22 11:46:23.007028 GSI
M6DR3B2000202A2 Slow Breakdown ~ 340V 42 2025-08-01 11:40:43.593515 GSI
M6DR3B4000204A2 slow bd at 125V, current at 150V (i=3microA) and current at EOF(i=10microA) 42 2025-08-01 11:46:30.803417 GSI
M5UR0B3011563B2 74 broken channels (5 on p-side and 67 on n-side). 62 of the n-side broken channels are located in the ASIC HW 6 42 2025-08-12 11:05:06.771619 GSI
M7UR0T2011592A2 Asymmetric current 42 2025-08-12 11:10:47.5664 GSI
M7UR0B0011590B2 Asymmetric current. Slow breakdown at ~ 430 V, I = 5.5 uA at EOL voltage 42 2025-08-12 11:22:25.014143 GSI
M7UR4T2011392A2 Asymmetric current 42 2025-08-12 11:29:53.994541 GSI
M7UR4T1011391A2 Asymmetric current 42 2025-08-12 11:31:21.698674 GSI
M7UR4T0011390A2 Asymmetric current 42 2025-08-12 11:34:24.519643 GSI
M7UR4B3111393B2 Module created 1 2025-08-13 11:06:09.558636 GSI
M7UR4B3011393B2 The sensor is broken. 1 2025-08-13 11:07:12.374151 GSI
M6UL4T0010360B2 IV after LA: first breakdown, then separate and arrange cables: perfect IV 75 2025-08-19 09:00:29.171417 GSI
M0DL2T3001093A2 ENC pattern all over p-side 42 2025-08-19 10:49:24.642084 GSI
M6UR1T2011352A2 Breakdown at 440V -> Dryout -->Resolved. Uplinks 4 and 5 (ASIC HW_2) are missing on N-SIDE. 42 2025-08-19 11:20:19.187756 GSI
M7UR2T2011392A2 Issue in ASIC HW_3 on n-side (bits are stuck on 243) 42 2025-08-19 11:29:07.395651 GSI
M7UR4B4011394B2 A spike at 10V, asymmetric current after 20V. 42 2025-08-19 11:36:17.319743 GSI
M6UL4T1010361B2 The module has a special connection from the p-side FEB to ground. Resistance between FEB and ground: P-Side: 7.1Ω, N-side: 0.3Ω. 75 2025-08-21 09:36:57.364838 GSI
M6UL4T1010361B2 on the sensor a (very) small part of the corner is not there 75 2025-08-27 10:35:41.957633 GSI
M6UL4B2010362A2 high currentasfter ladder assembly, biased overnight, then 250V at 8 micro A 75 2025-08-27 10:38:56.516592 GSI
M6UR1T4011354A2 Tested at LAD Assembly 22.08.2025. J. Heuser desided module ok. 75 2025-08-28 10:22:02.454801 GSI
M6UR1T3011353A2 Tested at LAD Assembly 28.08.2025. J.Heuser desided: module failed. 75 2025-08-28 10:27:24.695552 GSI
M6UR1T3111353A2 Module created 1 2025-08-28 14:44:28.114152 GSI
M0DR1T1100091B5 Module created 1 2025-08-28 15:47:56.653555 GSI
M0DR1T1000091B5 Modul assembled wrongly (P and N Side were swapped) 76 2025-08-28 15:52:30.36509 GSI
M6UL2T0010350B2 scratches on the P-Side before LA, IV ok 75 2025-09-02 11:28:16.620515 GSI
M6UL2T0010350B2 short circuit after ladder assembly 75 2025-09-05 13:03:54.618167 GSI
M4DL4B2101172B2 resistance to ground 5k Ohm, resistance FEB A to FEBB 0.3 Ohm, resistance Fin to Base 0.3 Ohm, 75 2025-09-09 10:03:47.100841 GSI
M6UL2T0110350B2 Module created 76 2025-09-17 13:51:52.03633 GSI
M8UR1T2011222A2 Spike at 250 to 275V and Asymmetric current. Resolved after dry out, but showing bd at 340V (grade A) 42 2025-09-24 13:48:22.697662 GSI
M8UR1T1011221A2 75 broken channels (53 on n-side and 22 on p-side) 42 2025-09-24 13:51:43.088458 GSI
M8UR3T2011222A2 75 broken channels (68 on p-side and 7 on n-side) 42 2025-09-24 14:05:41.230327 GSI
M8UR5T4011234A2 Asymmetric current 42 2025-09-24 14:12:35.34526 GSI
M8UR5T0011230A2 Asymmetric current 42 2025-09-24 14:13:11.921657 GSI
M8UR5B0011230B2 Asymmetric current 42 2025-09-24 14:16:45.322074 GSI
M8UR5B1011231B2 Asymmetric current 42 2025-09-24 14:17:23.750791 GSI
M8UR5B2011232B2 Asymmetric current 42 2025-09-24 14:17:58.380346 GSI
M8UR5B3011233B2 Asymmetric current 42 2025-09-24 14:18:36.314136 GSI
M8UR5B4011234B2 Asymmetric current 42 2025-09-24 14:19:00.207207 GSI
M7DL1T0001220A2 Resistance to ground 3 Ohm 75 2025-09-26 10:09:49.082231 GSI
M7DL1T0001220A2 Resistance to ground 3 Ohm 75 2025-09-26 10:10:41.705777 GSI
M7DL1T0001220A2 Resistance to ground 3 Ohm 75 2025-09-26 10:12:16.316335 GSI
M7DL1T0001220A2 Resistance to ground 3 Ohm 75 2025-09-26 10:12:45.654025 GSI
M7DL1T0001220A2 Resistance to ground 3Ohm 75 2025-09-26 10:13:12.22806 GSI
M7DR2B1000221A2 37 broken channels (33 on n-side and 4 on p-side) 42 2025-09-29 14:31:18.1787 GSI
M7DR2T2000222B2 36 broken channels (28 on n-side and 8 on p-side) 42 2025-09-29 14:35:06.051894 GSI
M7DR6T1000241B2 35 broken channels (27 on n-side and 8 on pside) 42 2025-09-29 14:42:11.464835 GSI
M7DL1T1001221A2 There is glue on the contacts for the power cables 75 2025-10-01 08:46:39.408489 GSI
M7DL1B3001223B2 Sensor broken before LA 75 2025-10-01 12:55:13.553048 GSI
M8UL2T3010223B2 fix DB 7 2025-10-07 09:09:45.352668 GSI
M0DR1T2000092B2 fix DB 7 2025-10-07 09:17:08.931764 GSI
M8UL4B4010224A2 fix DB 7 2025-10-07 09:19:05.080631 GSI
M7DL3B3001223B2 Slow breakdown at 150V 77 2025-10-07 11:06:34.748051 GSI
M5UR0B3011563B2 Ohmic behaviour 77 2025-10-07 11:14:19.115697 GSI
M4UL2T3010313B2 14 uA @ 3 V 7 2025-10-09 09:33:51.097017 GSI
M4UL2T3010313B2 Module at an Exhibition 7 2025-10-09 09:34:39.687312 GSI
M7DR4T1000221B2 Sensor broken in pieces 7 2025-10-09 09:38:23.167362 GSI
M7DL1B3001223B2 Sensor broken in pieces 7 2025-10-09 09:54:05.896805 GSI
M3UL5B0010140A2 Wrong cables bonded on first sensor side 7 2025-10-09 09:55:11.688711 GSI
M3UL5B1010141A2 Wrong cables bonded on first sensor side 7 2025-10-09 09:55:58.66528 GSI
M4UR1T2011312A2 M4UR1T2011312A2 nach Modultausch (alt: M4UR3T201131A) 1 2025-10-09 11:06:05.597488 GSI
M4UR3T2011312A2 M4UR1T2011312A2 nach Modultausch (alt: M4UR1T2011312A2) 1 2025-10-09 11:06:52.125607 GSI
M8UR1T1011221A2 75 broken channels 77 2025-10-15 10:23:30.297804 GSI
M8UR3T2011222A2 75 broken channels----> Pending 77 2025-10-15 10:33:42.918421 GSI
M8UR1T1011221A2 75 broken channels----> Pending 77 2025-10-15 10:33:55.040543 GSI
M1UL1B3010093A2 Ohmic behaviour 77 2025-10-15 10:40:05.657495 GSI
M8UR1B2011222B2 Fluctuating current 77 2025-10-15 11:07:24.327159 GSI
M8UR3T2011222A2 75 broken channels 77 2025-10-15 11:32:53.248025 GSI
M8UR1T1011221A2 75 broken channels 77 2025-10-15 11:33:51.171395 GSI
M7DR4T1000221B2 Correction 7 2025-10-16 08:42:21.360383 GSI
M3UL3T0010120B2 Fix doublet in Db 7 2025-10-16 08:52:53.029757 GSI
M8UR7T1011261A2 FEBs get inverted and this module is in GSI 77 2025-10-20 13:43:04.780242 GSI
M7UR6T1011261A2 FEBs get inverted and this module is in GSI 77 2025-10-20 13:44:09.391066 GSI
M1UL1B0010090A5 A small asymmetric current at EOF 77 2025-10-28 14:17:26.299091 GSI
M1UL1B1010091A5 A small asymmetric current at EOF 77 2025-10-28 14:17:34.878175 GSI
M1UL3B1010101A5 Small asymmetric current at EOL 77 2025-10-28 14:24:06.181234 GSI
M1UL3B3010103A2 Solder tin over an uplink capacitor 77 2025-10-28 14:24:44.892602 GSI
M7DR2B4000224A2 Slow breakdown at 125V. It reaches EOL (200V) with current 2.5microA. 77 2025-10-28 14:31:34.909223 GSI
M3UL5B1110141A2 Module created 76 2025-11-04 13:47:50.379564 GSI
M3UL5B0110140A2 Module created 76 2025-11-04 13:48:53.32815 GSI
M8UR3B0111220B2 Module created 76 2025-11-04 13:50:17.680852 GSI
M7DL1B3101223B2 Module created 76 2025-11-04 13:50:54.924853 GSI
M5DR0T2000562B2 Sensor recovered and tested 5 2025-11-06 08:33:23.832405 GSI
M5DR6T0000190B2 Sensor recovered and tested 5 2025-11-06 08:37:44.652873 GSI
M3UL5B0010140A2 Sensor recovered and tested 5 2025-11-06 08:38:03.289414 GSI
M4DR5T0000180B2 Sensor recovered and tested 5 2025-11-06 08:38:29.357483 GSI
M3UL5B1010141A2 Sensor recovered and tested 5 2025-11-06 08:38:50.870647 GSI
M6UR1T2011352A2 ASIC missing, waiting for spare cable 5 2025-11-06 08:50:11.822863 GSI
M4UL4T2010322B2 Sensor recovered and tested 5 2025-11-06 09:34:02.628558 GSI
M0DR1T1000091B5 Sensor recovered and tested 5 2025-11-06 10:14:54.983038 GSI
M5DR2T1000161B2 Sensor recovered and tested 5 2025-11-06 10:40:53.106516 GSI
M2DL2T3001123A2 Soft breakdown at 350v 1 2025-11-11 10:56:05.073049 GSI
M2DL0T2001532A2 Asymmetric current 1 2025-11-11 10:56:57.317457 GSI
M2DL0T1001531A2 Current raised after 200V 1 2025-11-11 10:57:44.789124 GSI
M8UL0B1010601A2 Grade B: Breakdown at 380 V 1 2025-11-12 07:05:46.316522 GSI
M3DR4B3000133A2 Module B3 high resitance 9000 Ohm HV Ground to Ground. Fixed by Ralf. 7 2025-11-19 14:44:07.594637 GSI
M8UL0B1010601A2 IV: brekdown at ~420 V. Reached 500 V at 4.5 uA after long Biasing. Desided to be used. 7 2025-11-19 14:47:02.208951 GSI
M4UL0B2010552A2 IV: rising current at 490 before Ladder assembly (3.3 uA) 7 2025-11-19 16:06:14.136834 GSI
M4UL0B2010552A2 IV after Ladder assembly: 10 uA at 410 V 7 2025-11-19 16:06:53.685353 GSI
M4UL0B2010552A2 IV: after long biasing: 8 uA at 500 V. Decided to use on Ladder (01.10.2025) 7 2025-11-19 16:10:16.411249 GSI
M7DR0B0000600A2 49 broken channels (14 on n-side and 35 on p-side) 77 2025-12-02 15:04:29.180012 GSI
M7DR0B2000602A2 51 broken channels (38 on n-side and 13 on p-side) 77 2025-12-02 15:05:12.386555 GSI
M7DR4T2000222B2 35 broken channels(8 on n-side and 27 on p-side) 77 2025-12-02 15:06:56.556704 GSI
M7UR4B0011390B2 39 broken channels 77 2025-12-02 15:09:50.03627 GSI
M7DR4B4000224A2 57 broken channels (14 on n-side and 43 on p-side) 77 2025-12-02 15:10:47.058113 GSI
M0DL0T0001500A5 A spike at 450V but IV continues to 500V 42 2025-12-09 10:59:42.61193 GSI
M1UL3T1010101B5 asymmetric current 42 2025-12-09 11:01:20.313123 GSI
M1UL3T2010102B5 Breakdown at 320V -> Resolved 42 2025-12-09 11:01:50.316018 GSI
M1UL3B2010102A5 Sharp breakdown at 475V -> Resolved 42 2025-12-09 11:02:23.480269 GSI
M1UL3T2010102B5 High ENC noise/ Broken HV filter capacitor 42 2025-12-09 11:07:43.714513 GSI
M1UL3T1010101B5 Breakdown at 370 V. Stored in Binder at 40 C for 72 hours // Breakdown at 460V. 42 2025-12-09 11:08:18.710501 GSI
M1UL3B2010102A5 Soft breakdown at 410 V // Again soft BD at 470V 42 2025-12-09 11:09:08.207463 GSI
M2UL2T3010283B2 28 broken channels (22 of them on ASIC HW_3 p-side) 42 2025-12-09 11:15:02.294761 GSI
M2DL0B2001532B2 54 broken channels 42 2025-12-09 11:19:55.738304 GSI
M2DL2T0001120A2 Slow breakdown at 450V > dry out after calibration and recovered 42 2025-12-09 11:27:43.45377 GSI
M2DL2T2001122A2 Early breakdown -> fixed after dry out 42 2025-12-09 11:28:16.940718 GSI
M2DL2T4001124A2 66 broken channels (60 of them on the ASIC HW_0 n-side) 42 2025-12-09 11:28:48.253686 GSI
M4UL0B2010552A2 Breakdown at 460V, current start raising till breakdown 42 2025-12-09 11:35:52.150447 GSI
M7DR0B1000601A2 Breakown at 400V -> recovered after dry out 42 2025-12-09 11:52:51.692482 GSI
M8UR1T1011221A2 It was decided (CJS) to use the Module as is. Status changed to test passed. 4 2025-12-10 10:49:56.370485 GSI