TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_48_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-019-14 | FUSED_ID : 6359364768379216190
  IC_TEMP :  -56.28 | VDDM : 1116.88 | AUX_INT :   -8.56 | CsaBias :   68.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17210e-03 / 2
  ADC_P0  : -8.56085e-03 ± 2.31523e-02
  ADC_P1  : 8.57016e-03 ± 5.73134e-04
  ADC_P2  : -6.52599e-06 ± 2.81232e-06
  CSA_Chi2/NDF : 1.47755e-04 / 2
  CSA_P0  : 5.84614e-02 ± 8.10761e-03
  CSA_P1  : 1.02213e-02 ± 6.10850e-04
  CSA_P2  : -5.30634e-05 ± 9.30252e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 39, 40, 59, 68, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 7, 18, 44, 57, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3826', '1.800', '0.1867', '1.800', '0.0992', '7.000', '0.7072', 1, 1, 1, 1, 1723722520.069105]
VI_after__Init : ['1.201', '0.3826', '1.800', '0.1867', '1.800', '0.0939', '7.000', '0.7073', 1, 1, 1, 1, 1723722528.0634923]
VI_at__the_End : ['1.201', '0.4879', '1.800', '0.1396', '1.803', '0.1140', '7.000', '0.7078', 1, 1, 1, 1, 1723722583.3543599]