TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_22_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-017-03 | FUSED_ID : 6359364768379220243
  IC_TEMP :  -55.34 | VDDM : 1131.72 | AUX_INT :   -7.79 | CsaBias :   68.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20473e-03 / 2
  ADC_P0  : -7.79167e-03 ± 2.35523e-02
  ADC_P1  : 8.48755e-03 ± 5.96810e-04
  ADC_P2  : -5.32545e-06 ± 3.00180e-06
  CSA_Chi2/NDF : 1.27822e-04 / 2
  CSA_P0  : 6.00476e-02 ± 7.54093e-03
  CSA_P1  : 9.91521e-03 ± 5.68155e-04
  CSA_P2  : -5.02657e-05 ± 8.65232e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [14, 19, 28, 34, 55, 57, 61, 72, 78, 91, 105, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [24, 31, 57, 58, 79, 101, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2812', '1.800', '0.1486', '1.799', '0.0878', '7.000', '0.7081', 1, 1, 1, 1, 1723724539.1209939]
VI_after__Init : ['1.201', '0.2812', '1.800', '0.1487', '1.800', '0.0815', '7.000', '0.7075', 1, 1, 1, 1, 1723724546.402379]
VI_at__the_End : ['1.201', '0.4819', '1.800', '0.1396', '1.803', '0.1121', '7.000', '0.7081', 1, 1, 1, 1, 1723724602.0260985]