TEST_NAME : Wafer
TEST_DATE : 24_08_16-15_00_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-014-04 | FUSED_ID : 6359364768380272868
  IC_TEMP :  -59.57 | VDDM : 1130.75 | AUX_INT :  -10.72 | CsaBias :   58.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.07226e-02 ± 2.84115e-02
  ADC_P1  : 8.71622e-03 ± 7.12868e-04
  ADC_P2  : -6.47022e-06 ± 3.57140e-06
  CSA_Chi2/NDF : 1.22988e-04 / 2
  CSA_P0  : 6.23141e-02 ± 7.39698e-03
  CSA_P1  : 1.01569e-02 ± 5.57309e-04
  CSA_P2  : -5.40595e-05 ± 8.48716e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 12, 15, 19, 22, 26, 47, 53, 77, 119, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [2, 4, 9, 21, 30, 32, 38, 50, 69, 70, 71, 73, 88, 96, 98, 113, 114, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4191', '1.800', '0.1483', '1.800', '0.0932', '7.000', '0.7074', 1, 1, 1, 1, 1723813258.5112548]
VI_after__Init : ['1.202', '0.4197', '1.800', '0.1484', '1.799', '0.0874', '7.000', '0.7074', 1, 1, 1, 1, 1723813266.5236716]
VI_at__the_End : ['1.202', '0.4836', '1.800', '0.1386', '1.803', '0.1143', '7.000', '0.7082', 1, 1, 1, 1, 1723813321.518249]