TEST_NAME : Wafer
TEST_DATE : 24_08_20-16_34_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-014-019-13 | FUSED_ID : 6359364768382378301
  IC_TEMP :  -66.72 | VDDM : 1114.52 | AUX_INT :   -9.82 | CsaBias :   57.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45204e-03 / 2
  ADC_P0  : -9.81760e-03 ± 2.57887e-02
  ADC_P1  : 8.49089e-03 ± 6.29506e-04
  ADC_P2  : -6.34243e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 1.51468e-04 / 2
  CSA_P0  : 5.63799e-02 ± 8.20886e-03
  CSA_P1  : 1.00893e-02 ± 6.18478e-04
  CSA_P2  : -5.69832e-05 ± 9.41869e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [5, 12, 17, 18, 24, 28, 50, 63, 64, 68, 77, 81, 85, 90, 98, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 10, 16, 27, 33, 36, 45, 47, 50, 67, 68, 78, 81, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2688', '1.800', '0.1394', '1.799', '0.0884', '7.000', '0.7077', 1, 1, 1, 1, 1724164499.4676208]
VI_after__Init : ['1.202', '0.2690', '1.800', '0.1394', '1.800', '0.0830', '7.000', '0.7082', 1, 1, 1, 1, 1724164507.386115]
VI_at__the_End : ['1.202', '0.4615', '1.800', '0.1352', '1.804', '0.1152', '7.000', '0.7084', 1, 1, 1, 1, 1724164564.3376937]